Measurement and characterization of pattern dependent process variations of interconnect resistance, capacitance and inductance in nanometer technologies
2010 ◽
Vol 57
(8)
◽
pp. 1838-1847
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Keyword(s):
Failure Characterization of Carbon Nanotube FETs Under Process Variations: Technology Scaling Issues
2016 ◽
Vol 16
(2)
◽
pp. 164-171
◽
2015 ◽
Vol 15
(10)
◽
pp. 8149-8154
◽
Keyword(s):
1999 ◽
Vol 34
(1)
◽
pp. 80-84
◽