Analytical signal integrity verification models for inductance-dominant multi-coupled VLSI interconnects

Author(s):  
Seongkyun Shin ◽  
Yungseon Eo ◽  
William R. Eisenstadt ◽  
Jongin Shim
2019 ◽  
Vol 13 (2) ◽  
pp. 231-237
Author(s):  
Teong Chee Chuah ◽  
Yin Hoe Ng ◽  
Nabihah Hashim ◽  
Ahmadun Nijar Zainal Abidin ◽  
Azhari Asrokin

Sign in / Sign up

Export Citation Format

Share Document