In Situ Monitoring and Real-Time Control of Gate Hardmask Etching in High-Volume Manufacturing of ICs
2008 ◽
Vol 155
(11)
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pp. D699
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2007 ◽
Vol 46
(28)
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pp. 5412-5416
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2003 ◽
Vol 2003
(9)
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pp. 255-276
Keyword(s):
Keyword(s):
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2002 ◽
Vol 13
(3)
◽
pp. 215-222
Keyword(s):
2005 ◽
Vol 44
(8)
◽
pp. 2716-2724
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