N2O Plasma Treatment Suppressed Temperature-dependent Point Defects
Formation with Amorphous Indium-Gallium-Zinc-Oxide Thin Film
Transistors
Keyword(s):
2013 ◽
Vol 231
◽
pp. 281-284
◽
2015 ◽
Vol 135
(6)
◽
pp. 192-198
◽
Keyword(s):
Keyword(s):
Keyword(s):
2011 ◽
Vol 50
(3)
◽
pp. 03CB06
◽
Keyword(s):