A Combined Investigation into the Effect of Ni/Mn/Co Ions on Lithium-Ion Battery Anodes Using X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry

2014 ◽  
Keyword(s):  
Mass Spectrometry ◽  
Lithium Ion Battery ◽  
Photoelectron Spectroscopy ◽  
Secondary Ion Mass Spectrometry ◽  
Lithium Ion ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Secondary Ion

XPS and Sims Studies of CVD-GROWN Cubic SiC Films on Si(100)

1994 ◽  
Vol 339 ◽  
Author(s):  
A. T. S. Wee ◽  
Z. C. Feng ◽  
H. H. Hng ◽  
K. L. Tan ◽  
C. C. Tin ◽  
...  
Keyword(s):  
Mass Spectrometry ◽  
Photoelectron Spectroscopy ◽  
Chemical Etching ◽  
Secondary Ion Mass Spectrometry ◽  
Growth Time ◽  
X Ray ◽  
Ion Mass Spectrometry ◽  
Compositional Variations ◽  
Secondary Ion ◽  
Sic Films

ABSTRACTA series of CVD-grown 3C-SiC/Si(100) films of different growth times, and hence film thicknesses, are studied by X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). XPS showed that the surfaces of the samples consist of Si oxides (SiO2 and SiOx where x < 2) and unreacted C.H. Unreacted elemental Si is also present and its amount decreases with increasing growth time. This surface overlayer is further investigated by changing the photoelectron take-off angle and from chemical etching studies. Compositional variations of the SiC films are also studied using SIMS.

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