Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted Polystyrene

Applied Spectroscopy ◽

10.1366/0003702914337588 ◽

1991 ◽

Vol 45 (2) ◽

pp. 209-217 ◽

Author(s):

Ashutosh Chilkoti ◽

David G. Castner ◽

Buddy D. Ratner

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy study of 2‐phenylimidazole on brass

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8974 ◽

2020 ◽

Vol 35 (2) ◽

Author(s):

Matjaž Finšgar

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Spectroscopy Study ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Probing albumin adsorption onto calcium phosphates by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.3613919 ◽

2011 ◽

Vol 29 (4) ◽

pp. 04D113 ◽

Author(s):

J. E. Baio ◽

T. Weidner ◽

G. Interlandi ◽

C. Mendoza-Barrera ◽

H. E. Canavan ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Calcium Phosphates ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

Albumin Adsorption ◽

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Combined instrument for the on‐line investigation of plasma deposited or etched surfaces by monochromatized x‐ray photoelectron spectroscopy and time‐of‐flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.578851 ◽

1994 ◽

Vol 12 (3) ◽

pp. 671-676 ◽

Author(s):

P. W. Jahn ◽

F. M. Petrat ◽

D. Wolany ◽

M. Deimel ◽

T. Gantenfort ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

On Line ◽

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A Combined Investigation into the Effect of Ni/Mn/Co Ions on Lithium-Ion Battery Anodes Using X-Ray Photoelectron Spectroscopy and Secondary Ion Mass Spectrometry

ECS Meeting Abstracts ◽

10.1149/ma2014-01/2/245 ◽

2014 ◽

Keyword(s):

Mass Spectrometry ◽

Lithium Ion Battery ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Lithium Ion ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Interaction of nitrogen and ammonia plasmas with polystyrene and polycarbonate studied by X-ray photoelectron spectroscopy, neutron activation analysis and static secondary ion mass spectrometry

Polymer ◽

10.1016/0032-3861(89)90380-7 ◽

1989 ◽

Vol 30 (1) ◽

pp. 40-44 ◽

Author(s):

J. Lub ◽

F.C.B.M. van Vroonhoven ◽

E. Bruninx ◽

A. Benninghoven

Keyword(s):

Mass Spectrometry ◽

Neutron Activation Analysis ◽

Activation Analysis ◽

Neutron Activation ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

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97/05172 Identification of inorganic nitrogen in an Australian bituminous coal using X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (TOFSIMS)

Fuel and Energy Abstracts ◽

10.1016/s0140-6701(97)82445-9 ◽

1997 ◽

Vol 38 (6) ◽

pp. 448-449

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Bituminous Coal ◽

Secondary Ion Mass Spectrometry ◽

Inorganic Nitrogen ◽

Time Of Flight ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Surface analysis: x-ray photoelectron spectroscopy, Auger electron spectroscopy, and secondary ion mass spectrometry

Analytical Chemistry ◽

10.1021/ac00242a027 ◽

1982 ◽

Vol 54 (5) ◽

pp. 293-322 ◽

Author(s):

Noel H. Turner ◽

Richard J. Colton

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Surface Analysis ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Secondary ion mass spectrometry and X-ray photoelectron spectroscopy of Na2MoO4/SiO2 catalysts for methane oxidative coupling

Journal of the Chemical Society Faraday Transactions ◽

10.1039/ft9959100381 ◽

1995 ◽

Vol 91 (2) ◽

pp. 381 ◽

Author(s):

Yong S. Jin ◽

Qi J. Yan ◽

Zhong R. Yin ◽

Yi Chen

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Oxidative Coupling ◽

Secondary Ion Mass Spectrometry ◽

Methane Oxidative Coupling ◽

X Ray ◽

Ion Mass Spectrometry ◽

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Analysis of stoichiometry and oxide growth of HF treated GaAs (100) by x-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

10.1116/1.587172 ◽

1994 ◽

Vol 12 (1) ◽

pp. 147 ◽

Author(s):

W. Storm

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Oxide Growth ◽

X Ray ◽

Ion Mass Spectrometry ◽

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XPS and Sims Studies of CVD-GROWN Cubic SiC Films on Si(100)

MRS Proceedings ◽

10.1557/proc-339-411 ◽

1994 ◽

Vol 339 ◽

Author(s):

A. T. S. Wee ◽

Z. C. Feng ◽

H. H. Hng ◽

K. L. Tan ◽

C. C. Tin ◽

...

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Chemical Etching ◽

Secondary Ion Mass Spectrometry ◽

Growth Time ◽

X Ray ◽

Ion Mass Spectrometry ◽

Compositional Variations ◽

Secondary Ion ◽

ABSTRACTA series of CVD-grown 3C-SiC/Si(100) films of different growth times, and hence film thicknesses, are studied by X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). XPS showed that the surfaces of the samples consist of Si oxides (SiO2 and SiOx where x < 2) and unreacted C.H. Unreacted elemental Si is also present and its amount decreases with increasing growth time. This surface overlayer is further investigated by changing the photoelectron take-off angle and from chemical etching studies. Compositional variations of the SiC films are also studied using SIMS.

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