scholarly journals Correlation between subgrains and coherently scattering domains

2005 ◽  
Vol 20 (4) ◽  
pp. 366-375 ◽  
Author(s):  
T. Ungár ◽  
G. Tichy ◽  
J. Gubicza ◽  
R. J. Hellmig
Keyword(s):  
Electron Microscopy ◽  
Line Profile ◽  
Profile Analysis ◽  
Subgrain Size ◽  
Domain Size ◽  
Line Profile Analysis ◽  
X Rays ◽  
X Ray ◽  
Transmission Electron ◽  
Dislocation Walls

Crystallite size determined by X-ray line profile analysis is often smaller than the grain or subgrain size obtained by transmission electron microscopy, especially when the material has been produced by plastic deformation. It is shown that besides differences in orientation between grains or subgrains, dipolar dislocation walls without differences in orientation also break down coherency of X-rays scattering. This means that the coherently scattering domain size provided by X-ray line profile analysis provides subgrain or cell size bounded by dislocation boundaries or dipolar walls.

scholarly journals Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

2007 ◽  
Vol 222 (11/2007) ◽  
Author(s):  
Jenõ Gubicza ◽  
Tamás Ungár
Keyword(s):  
Line Profile ◽  
Nanocrystalline Materials ◽  
Profile Analysis ◽  
Subgrain Size ◽  
Line Profile Analysis ◽  
Line Broadening ◽  
X Ray ◽  
Transmission Electron ◽  
Fitting Procedures ◽  
Dislocation Type

X-ray line profile analysis is a powerful alternative tool for determining dislocation densities, dislocation type, crystallite and subgrain size and size-distributions, and planar defects, especially the frequency of twin boundaries and stacking faults. The method is especially useful in the case of submicron grain size or nanocrystalline materials, where X-ray line broadening is a well pronounced effect, and the observation of defects with very large density is often not easy by transmission electron microscopy. The fundamentals of X-ray line broadening are summarized in terms of the different qualitative breadth methods, and the more sophisticated and more quantitative whole pattern fitting procedures. The efficiency and practical use of X-ray line profile analysis is shown by discussing its applications to metallic, ceramic, diamond-like and polymer nanomaterials.

Line profile analysis: pattern modellingversusprofile fitting

2006 ◽  
Vol 39 (1) ◽  
pp. 24-31 ◽  
Author(s):  
Paolo Scardi ◽  
Matteo Leoni
Keyword(s):  
Line Profile ◽  
Powder Diffraction ◽  
Profile Analysis ◽  
Domain Size ◽  
Systematic Errors ◽  
Powder Pattern ◽  
Line Profile Analysis ◽  
Microstructural Parameters ◽  
Profile Fitting ◽  
Transmission Electron

Powder diffraction data collected on a nanocrystalline ceria sample within a round robin conducted by the IUCr Commission on Powder Diffraction were analysed by two alternative approaches: (i) whole-powder-pattern modelling based upon a fundamental microstructural parameters approach, and (ii) a traditional whole-powder-pattern fitting followed by Williamson–Hall and Warren–Averbach analysis. While the former gives results in close agreement with those of transmission electron microscopy, the latter tends to overestimate the domain size effect, providing size values about 20% smaller. The origin of the discrepancy can be traced back to a substantial inadequacy of profile fitting with Voigt profiles, which leads to systematic errors in the following line profile analysis by traditional methods. However, independently of the model, those systematic errors seem to have little effect on the volume-weighted mean size.

INVESTIGATION OF SURFACE GRADIENT MICROSTRUCTURE OF SHOT PEENED S30432 STEEL BY X-RAY LINE PROFILE ANALYSIS METHOD

2016 ◽  
Vol 24 (06) ◽  
pp. 1750078 ◽  
Author(s):  
K. ZHAN ◽  
W. Q. FANG ◽  
B. ZHAO ◽  
Y. YAN ◽  
Q. FENG ◽  
...  
Keyword(s):  
Line Profile ◽  
Shot Peening ◽  
Profile Analysis ◽  
Rietveld Method ◽  
Size Variation ◽  
Domain Size ◽  
Line Profile Analysis ◽  
Analysis Method ◽  
X Ray ◽  
Gradient Microstructure

S30432 steels were processed by multistep shot peening treatment. The refined microstructures, including domain size, microstrain, domain size distribution and texture were characterized by X-ray diffraction (XRD) line profile analysis method, respectively. The results demonstrate that in the deformed layers, a gradient structure is formed after shot peening. The domain size reaches 25[Formula: see text]nm at the surface, then it decreases as the depth increases, but microstrain (0.0027) is the largest at the surface. The domain size distributions at different depths calculated by Rietveld method are consistent with domain size variation along the depth. There are no strong textures after shot peening treatment. The change of microhardness along the depth is in accordance with the gradient microstructure. It is expected that this work can offer useful information for characterizing the microstructure of shot peened materials.

scholarly journals Microstructure Characterization in Individual Texture Components by X-Ray Line Profile Analysis: Principles of the X-TEX Method and Practical Application to Tensile-Deformed Textured Ti

Crystals ◽  
2020 ◽  
Vol 10 (8) ◽  
pp. 691
Author(s):  
Bertalan Jóni ◽  
Éva Ódor ◽  
Mia Maric ◽  
Wolfgang Pantleon ◽  
Tamás Ungár
Keyword(s):  
Line Profile ◽  
Profile Analysis ◽  
Subgrain Size ◽  
Pure Titanium ◽  
Evaluation Procedure ◽  
Line Profile Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Dislocation Densities ◽  
Diffraction Peaks

A novel X-ray diffraction-based method and computer program X-TEX has been developed to determine the microstructure in individual texture components of polycrystalline, textured materials. Two different approaches are presented. In the first one, based on the texture of the specimen, the X-TEX software provides optimized specimen orientations for X-ray diffraction experiments in which diffraction peaks consist of intensity contributions stemming from grain populations of separate texture components in the specimen. Texture-specific diffraction patterns can be created by putting such peaks together from different measurements into an artificial pattern for each texture component. In the second one, the X-TEX software can determine the intensity contributions of different texture components to diffraction peaks measured in a particular sample orientation. According to this, peaks belonging mainly to one of the present texture components are identified and grouped into the same quasi-phase during the evaluation procedure. The X-TEX method was applied and tested on tensile-deformed, textured, commercially pure titanium samples. The patterns were evaluated by the convolutional multiple whole profile (CMWP) procedure of line profile analysis for dislocation densities, dipole character, slip systems and subgrain size for three different texture components of the Ti specimens. Significant differences were found in the microstructure evolution in the two major and the random texture components. The dislocation densities were discussed by the Taylor model of work hardening.

Determination of Nanocrystalline Fe80Cr20 Powder Based Alloys Using Williamson-Hall Method

2010 ◽  
Vol 129-131 ◽  
pp. 999-1003 ◽  
Author(s):  
Hendi Saryanto ◽  
S. Khaerudini Deni ◽  
Pudji Untoro ◽  
Mat Husin Saleh ◽  
Darwin Sebayang
Keyword(s):  
Mechanical Alloying ◽  
Crystallite Size ◽  
Line Profile ◽  
Profile Analysis ◽  
Line Profile Analysis ◽  
X Rays ◽  
Diffraction Line Profile ◽  
Transmission Electron ◽  
Microstructure Morphology ◽  
Hall Method

The aim of this study is to determine the nanocrystalline size by using Williamson-Hall method of Fe80Cr20 powder which prepared by mechanical alloying process. X-rays diffraction line profile analysis was adopted to analyze the crystallite size and microstrains of Fe80Cr20 alloys powder. Transmission Electron Microscopy (TEM) was used to examine the microstructure morphology of the nanosized of Fe80Cr20 alloys. The crystallite size, microstrain, and lattice parameters were estimated by Williamson–Hall plot. The results showed that the mechanical alloying processes resulted the final product in nanocrystalline size range (below 12 nm) which confirmed by TEM observation and XRD line profile analysis.

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