Tests of microstructure reconstruction by forward modeling of high energy X-ray diffraction microscopy data

2010 ◽  
Vol 25 (2) ◽  
pp. 132-137 ◽  
Author(s):  
C. M. Hefferan ◽  
S. F. Li ◽  
J. Lind ◽  
R. M. Suter
Keyword(s):  
Near Field ◽  
Simulated Data ◽  
Forward Modeling ◽  
High Energy ◽  
Data Sets ◽  
Geometric Accuracy ◽  
X Ray Diffraction ◽  
Detector Resolution ◽  
X Ray ◽  
Diffraction Microscopy

Verification tests of the forward modeling technique for near-field high energy X-ray diffraction microscopy are conducted using two simulated microstructures containing uniformly distributed orientations. Comparison between the simulated and reconstructed microstructures is examined with consideration to both crystallographic orientation and spatial geometric accuracy. To probe the dependence of results on experimental parameters, simulated data sets use two different detector configurations and different simulated experimental protocols; in each case, the parameters mimic the experimental geometry used at Advanced Photon Source beamline 1-ID. Results indicate that element orientations are distinguishable to less than 0.1°, while spatial geometric accuracy is limited by the detector resolution.

scholarly journals Three-dimensional α colony characterization and prior-β grain reconstruction of a lamellar Ti–6Al–4V specimen using near-field high-energy X-ray diffraction microscopy

2015 ◽  
Vol 48 (4) ◽  
pp. 1165-1171 ◽  
Author(s):  
E. Wielewski ◽  
D. B. Menasche ◽  
P. G. Callahan ◽  
R. M. Suter
Keyword(s):  
Near Field ◽  
Three Dimensional ◽  
High Energy ◽  
Grain Structure ◽  
X Ray Diffraction ◽  
Orientation Field ◽  
X Ray ◽  
Hexagonal Close Packed ◽  
Flood Fill ◽  
Diffraction Microscopy

Near-field high-energy X-ray diffraction microscopy has been used to characterize the three-dimensional (3-D) crystallographic orientation field of the hexagonal close-packed α phase in a bulk Ti–6Al–4V specimen with a lamellar (β-annealed) microstructure. These data have been segmented using a 3-D misorientation-based grain finding algorithm, providing unprecedented information about the complex 3-D morphologies and spatial misorientation distributions of the transformed α lamella colonies. A 3-D Burgers orientation relationship-based flood-fill algorithm has been implemented to reconstruct the morphologies and crystallographic orientations of the high-temperature body-centered cubic prior-β grains. The combination of these data has been used to gain an understanding of the role of the prior-β grain structure in the formation of specific morphologies and spatial misorientation distributions observed in the transformed α colony structures. It is hoped that this understanding can be used to develop transformation structures optimized for specific applications and to produce more physically realistic synthetic microstructures for use in simulations.

Demonstration of near Field High Energy X-Ray Diffraction Microscopy on High-Z Ceramic Nuclear Fuel Material

2014 ◽  
Vol 777 ◽  
pp. 112-117 ◽  
Author(s):  
Donald W. Brown ◽  
Levente Balogh ◽  
Darrin Byler ◽  
Chris M. Hefferan ◽  
James F. Hunter ◽  
...  
Keyword(s):  
Nuclear Fuel ◽  
Near Field ◽  
Grain Morphology ◽  
High Energy ◽  
X Ray Diffraction ◽  
Boundary Misorientation ◽  
Sintered Ceramic ◽  
X Ray ◽  
Diffraction Microscopy ◽  
Fuel Material

Near-field high energy x-ray diffraction microscopy (nf-HEDM) and high energy x-ray micro-tomography (μT) have been utilized to characterize the pore structure and grain morphology in sintered ceramic UO2nuclear fuel material. μT successfully images pores to 2-3μm diameters and is analyzed to produce a pore size distribution. It is apparent that the largest number of pores and pore volume in the sintered ceramic are below the current resolution of the technique, which might be more appropriate to image cracks in the same ceramics. Grain orientation maps of slices determined by nf-HEDM at 25 μm intervals are presented and analyzed in terms of grain boundary misorientation angle. The benefit of these two techniques is that they are non-destructive and thus could be performed before and after processes (such as time at temperature or in-reactor) or even in-situ.

Measuring stress-induced martensite microstructures using far-field high-energy diffraction microscopy

2018 ◽  
Vol 74 (5) ◽  
pp. 425-446 ◽  
Author(s):  
Ashley Nicole Bucsek ◽  
Darren Dale ◽  
Jun Young Peter Ko ◽  
Yuriy Chumlyakov ◽  
Aaron Paul Stebner
Keyword(s):  
Phase Transformation ◽  
Three Dimensional ◽  
Infinite Plate ◽  
Direct Analysis ◽  
High Energy ◽  
Data Sets ◽  
Far Field ◽  
X Ray Diffraction ◽  
Parent Austenite ◽  
Diffraction Microscopy

Modern X-ray diffraction techniques are now allowing researchers to collect long-desired experimental verification data sets that are in situ, three-dimensional, on the same length scales as critical microstructures, and using bulk samples. These techniques need to be adapted for advanced material systems that undergo combinations of phase transformation, twinning and plasticity. One particular challenge addressed in this article is direct analysis of martensite phases in far-field high-energy diffraction microscopy experiments. Specifically, an algorithmic forward model approach is presented to analyze phase transformation and twinning data sets of shape memory alloys. In the present implementation of the algorithm, the crystallographic theory of martensite (CTM) is used to predict possible martensite microstructures (i.e. martensite orientations, twin mode, habit plane, twin plane and twin phase fractions) that could form from the parent austenite structure. This approach is successfully demonstrated on three single- and near-single-crystal NiTi samples where the fundamental assumptions of the CTM are not upheld. That is, the samples have elastically strained lattices, inclusions, precipitates, subgrains, R-phase transformation and/or are not an infinite plate. The results indicate that the CTM still provides structural solutions that match the experiments. However, the widely accepted maximum work criterion for predicting which solution of the CTM should be preferred by the material does not work in these cases. Hence, a more accurate model that can simulate these additional structural complexities can be used within the algorithm in the future to improve its performance for non-ideal materials.

On the calibration of high-energy X-ray diffraction setups. I. Assessing tilt and spatial distortion of the area detector

2014 ◽  
Vol 47 (3) ◽  
pp. 1042-1053 ◽  
Author(s):  
Andras Borbely ◽  
Loic Renversade ◽  
Peter Kenesei ◽  
Jonathan Wright
Keyword(s):  
Rotation Axis ◽  
Strain Tensor ◽  
Calibration Procedure ◽  
High Energy ◽  
European Synchrotron Radiation Facility ◽  
Data Sets ◽  
X Ray Diffraction ◽  
Spatial Distortion ◽  
X Ray ◽  
Area Detector

The geometry of high-energy X-ray diffraction setups using an area detector and a rotation axis is analysed. The present paper (part 1) describes the methodology for determining continuously varying spatial distortions and tilt of the area detector based on the reference diffraction rings of a certified powder. Analytical expressions describing the degeneration of Debye rings into ellipses are presented and a robust calibration procedure is introduced. It is emphasized that accurate detector calibration requires the introduction of spatial distortion into the equation describing the tilt. The method is applied to data sets measured at the Advanced Photon Source and at the European Synchrotron Radiation Facility using detectors with different physical characteristics, the GE 41RT flat-panel and the FReLoN4M detector, respectively. The spatial distortion of the detectors is compared with regard to their use in structural and strain tensor analysis, a subject treated in part 2 of the calibration work [Borbély, Renversade & Kenesei (2014).J. Appl. Cryst.Submitted].

scholarly journals Characterization of neutron-irradiated HT-UPS steel by high-energy X-ray diffraction microscopy

2016 ◽  
Vol 471 ◽  
pp. 280-288 ◽  
Author(s):  
Xuan Zhang ◽  
Jun-Sang Park ◽  
Jonathan Almer ◽  
Meimei Li
Keyword(s):  
High Energy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Microscopy
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