X-Ray Projection Microradiography and Divergent Beam Techniques

1958 ◽  
Vol 2 ◽  
pp. 283-291
Author(s):  
F. W. Von Batchelder
Keyword(s):  
Single Crystals ◽  
Focal Spot ◽  
Divergent Beam ◽  
X Ray ◽  
Preliminary Results ◽  
Fine Grain ◽  
Ray Projection ◽  
Nonferrous Alloys

AbstractThe topics to be covered are X-ray projection imcroradiography, which embodies the examination of thin poly crystalline sections with the aid of a microfocus X-ray unit, and similar divergent beam examination of thin single crystals.In X-ray projection or shadow microradiography we restrict our interest to the field of metallurgy and typical examples will be illustrated from ferrous and nonferrous alloys. No special techniques are necessary in the making of these microradiographs, which are recorded on industrial fine grain X-ray film, and which are processed and viewed like regular radiographs. A Hilger microfocus unit operated at 45 kv, 250μa, using a Cu target, 40 micron focal spot was employed.Some preliminary results will be illustrated from our application of the divergent beam technique.to single crystals.

Divergent Beam X-Ray Photography of Metallic Single Crystals

1947 ◽  
Vol 72 (10) ◽  
pp. 983-984 ◽  
Author(s):  
A. H. Geisler ◽  
J. K. Hill ◽  
J. B. Newkirk
Keyword(s):  
Single Crystals ◽  
Divergent Beam ◽  
X Ray

Projection Microscopy and Microanalyses*

1961 ◽  
Vol 5 ◽  
pp. 324-334
Author(s):  
Ong Sing Poen
Keyword(s):  
Pulse Height ◽  
Emission Spectra ◽  
Line Radiation ◽  
Pulse Height Analyzer ◽  
Divergent Beam ◽  
X Ray ◽  
Specimen Holder ◽  
Beam Type ◽  
Fluorescent Radiation ◽  
Ray Projection

AbstractResults of recent experiments on microanalyses with an X-ray projection microscope will be reviewed. As the use of monochromatic radiation is imperative, spectral analyses of the point source were carried out. A simple stationary divergent-beam-type transmission spectrograph was used. The shape and size were miniaturized to fit in the specimen holder of the Norelco projection unit. Emission spectra from clean, targets and the fluorescent radiation emerging from a 10- to 50-μ-diameter spot of contaminated targets and of two-layer targets will be shown. The spectra were recorded photographically. In addition, a proportional counter, in combination with the R.C.L. 128-channel pulse-height analyzer, was used for measuring the ratio of “white” to line radiation.

The analysis of strained surface layers on single crystals utilizing divergent‐beam x‐ray patterns

1981 ◽  
Vol 52 (9) ◽  
pp. 5496-5500 ◽  
Author(s):  
R. J. Schutz ◽  
L. R. Testardi ◽  
S. Weissmann
Keyword(s):  
Single Crystals ◽  
Surface Layers ◽  
Divergent Beam ◽  
X Ray ◽  
Ray Patterns

The Application of Neutron Topography to the Study of X-ray Sensitive Organic Crystals - a Possible Alternative to X-ray Topography.

1989 ◽  
Vol 166 ◽  
Author(s):  
M. Dudley
Keyword(s):  
Neutron Technique ◽  
Solid State ◽  
Single Crystals ◽  
Spatial Resolution ◽  
Organic Crystals ◽  
Strain Sensitivity ◽  
X Ray ◽  
Preliminary Results ◽  
Extreme Sensitivity

ABSTRACTNeutron topography has been carried out on organic single crystals of varying Xray sensitivity, in order to test the feasibility of the technique as an alternative to X-ray topography for the study of the influence of defects on the solid state reactivity of X-ray sensitive single crystals. Specimens studied include the diacetylene PTS, and Pyrene. A comparison of the strain sensitivity and spatial resolution of the neutron and X-ray based techniques is made. Preliminary results of dynamic neutron topographic studies of the UV induced polymerization in PTS are presented. These results are compared to those obtained from similar X-ray topographic studies.Results indicate that the neutron technique can be a useful ally technique to the analogous X-ray techniques in studies of the influence of defects on reactivity in specimens of moderate X-ray sensitivity. In cases of extreme sensitivity, the neutron technique is the only one available for studies of this nature.

Aspects of microanalysis in a transmission electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 510-511
Author(s):  
R. Sinclair ◽  
B.E. Jacobson
Keyword(s):  
Grain Size ◽  
Electron Beam ◽  
Electron Microscope ◽  
Chemical Analysis ◽  
Transmission Electron Microscope ◽  
Vapor Deposition ◽  
Critical Currents ◽  
X Ray ◽  
Fine Grain ◽  
Transmission Electron

INTRODUCTIONThe prospect of performing chemical analysis of thin specimens at any desired level of resolution is particularly appealing to the materials scientist. Commercial TEM-based systems are now available which virtually provide this capability. The purpose of this contribution is to illustrate its application to problems which would have been intractable until recently, pointing out some current limitations.X-RAY ANALYSISIn an attempt to fabricate superconducting materials with high critical currents and temperature, thin Nb3Sn films have been prepared by electron beam vapor deposition [1]. Fine-grain size material is desirable which may be achieved by codeposition with small amounts of Al2O3 . Figure 1 shows the STEM microstructure, with large (∽ 200 Å dia) voids present at the grain boundaries. Higher quality TEM micrographs (e.g. fig. 2) reveal the presence of small voids within the grains which are absent in pure Nb3Sn prepared under identical conditions. The X-ray spectrum from large (∽ lμ dia) or small (∽100 Ǻ dia) areas within the grains indicates only small amounts of A1 (fig.3).

Zone-axis ALCHEMI for the rapid assessment of site occupancies in garnets

1986 ◽  
Vol 44 ◽  
pp. 706-707
Author(s):  
M.T. Otten ◽  
P.R. Buseck
Keyword(s):  
Single Crystals ◽  
Rapid Assessment ◽  
Site Occupancy ◽  
Zone Axis ◽  
Synthetic Compounds ◽  
X Ray ◽  
Large Group ◽  
Crystallographic Planes

ALCHEMI (Atom Location by CHannelling-Enhanced Microanalysis) is a TEM technique for determining site occupancies in single crystals. The method uses the channelling of incident electrons along specific crystallographic planes. This channelling results in enhanced x-ray emission from the atoms on those planes, thereby providing the required site-occupancy information. ALCHEMI has been applied with success to spinel, olivine and feldspar. For the garnets, which form a large group of important minerals and synthetic compounds, the channelling effect is weaker, and significant results are more difficult to obtain. It was found, however, that the channelling effect is pronounced for low-index zone-axis orientations, yielding a method for assessing site occupancies that is rapid and easy to perform.

XRMF applications of a monolithic, polycapillary, focusing x-ray optic

1996 ◽  
Vol 54 ◽  
pp. 240-241
Author(s):  
D. A. Carpenter ◽  
Ning Gao ◽  
G. J. Havrilla
Keyword(s):  
Trace Elements ◽  
Point Source ◽  
Focal Spot ◽  
Fluorescence Analysis ◽  
X Rays ◽  
Focal Distance ◽  
Spot Diameter ◽  
X Ray ◽  
Focal Spot Diameter

A monolithic, polycapillary, x-ray optic was adapted to a laboratory-based x-ray microprobe to evaluate the potential of the optic for x-ray micro fluorescence analysis. The polycapillary was capable of collecting x-rays over a 6 degree angle from a point source and focusing them to a spot approximately 40 µm diameter. The high intensities expected from this capillary should be useful for determining and mapping minor to trace elements in materials. Fig. 1 shows a sketch of the capillary with important dimensions.The microprobe had previously been used with straight and with tapered monocapillaries. Alignment of the monocapillaries with the focal spot was accomplished by electromagnetically scanning the focal spot over the beveled anode. With the polycapillary it was also necessary to manually adjust the distance between the focal spot and the polycapillary.The focal distance and focal spot diameter of the polycapillary were determined from a series of edge scans.

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