The analysis of strained surface layers on single crystals utilizing divergent‐beam x‐ray patterns

A method has been devised by Dr Alex Müller for determining the orientation of a single-crystal of metal by photographic measurement of the reflection of characteristic X-rays from surface layers. The incident beam passes perpendicularly through an axis of rotation around which the crystal is turned until a reflection is obtained with one of the component wave-lengths of the X-rays.

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The method of integral characteristics in X-ray diffraction studies of the structure of the surface layers of single crystals

phys stat sol (a) ◽

10.1002/pssa.2210640203 ◽

1981 ◽

Vol 64 (2) ◽

pp. 435-442 ◽

Cited By ~ 11

Author(s):

V. G. Kohn ◽

M. V. Kovalchuk ◽

R. M. Imamov ◽

E. F. Lobanovich

Keyword(s):

Single Crystals ◽

X Ray Diffraction ◽

Surface Layers ◽

X Ray ◽

Integral Characteristics

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High-temperature transformation of tridymite single crystals to cristobalite*

Zeitschrift für Kristallographie - Crystalline Materials ◽

10.1524/zkri.1986.175.3-4.165 ◽

1986 ◽

Vol 175 (3-4) ◽

Cited By ~ 5

Author(s):

H. Schneider ◽

O. W. Flörke

Keyword(s):

High Temperature ◽

Single Crystals ◽

Tetrahedral Framework ◽

X Ray ◽

Layer Sequence ◽

Heat Treated ◽

Parallel Layer ◽

Temperature Transformation ◽

Ray Patterns ◽

Tetrahedral Layer

AbstractThe reconstructive high-temperature transformation of tridymite to cristobalite has been studied with X-ray precession photographs on single crystals. For this purpose inclusion-free and optically untwinned tridymite crystals, separated from a used refractory-grade silica brick were heat-treated between 1500 and 1620°C.The X-ray patterns of the heat-treated tridymite crystals show additional though weak reflections corresponding to those of the pseudo-orthorhombic tridymite TThe close structural relationship between tridymite and cristobalite probably causes a transformation with preservation of structural units. The reconstructive rearrangement of the “antiparallel” tetrahedral layer sequence in tridymite to the “parallel” layer sequence in cristobalite requires rotation and shifting of the tetrahedral layers which occurs by cooperative movements of layer fragments. Complete decomposition of the tridymite tetrahedral framework, and subsequent nucleation and growth of cristobalite is less probable.

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CO-CRYSTALLIZATION OF C60 AND С70 FULLERENES IN CRYSTAL-SOLVATE [(C70)X+(С60)Y]• TMTSeF•2(C6H6) (х+у=3)

IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENIY KHIMIYA KHIMICHESKAYA TEKHNOLOGIYA ◽

10.6060/tcct.20165909.3y ◽

2018 ◽

Vol 59 (9) ◽

pp. 21

Author(s):

Maksim A. Blagov ◽

Nataliya G. Spitsina ◽

Sergei V. Konovalikhin

Keyword(s):

Charge Transfer ◽

Single Crystals ◽

Spectral Data ◽

Fullerene Molecule ◽

Crystal Solvate ◽

Organic P ◽

X Ray ◽

Ray Patterns ◽

C60 Fullerenes

The compexation of (С70/C60) fullerenes with organic p-donor of electrons tetramethyl-(tetra selenium)fulvalene (TMTSeF) in benzene (С6Н6) was studied. Comparison of experimental and calculated X-ray patterns showed that in the investigated single crystals of [(C70)x+(С60)y]· TMTSeF·2(C6H6) (х+у=3) (1) С70 and C60 fullerens are co-crystallized. IR spectral data and electroconductivity of 1 indicate the absence of the charge transfer on fullerene molecule for complexes under study.

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X-Ray Projection Microradiography and Divergent Beam Techniques

Advances in X-ray Analysis ◽

10.1154/s0376030800000598 ◽

1958 ◽

Vol 2 ◽

pp. 283-291

Author(s):

F. W. Von Batchelder

Keyword(s):

Single Crystals ◽

Focal Spot ◽

Divergent Beam ◽

X Ray ◽

Preliminary Results ◽

Fine Grain ◽

Ray Projection ◽

Nonferrous Alloys

AbstractThe topics to be covered are X-ray projection imcroradiography, which embodies the examination of thin poly crystalline sections with the aid of a microfocus X-ray unit, and similar divergent beam examination of thin single crystals.In X-ray projection or shadow microradiography we restrict our interest to the field of metallurgy and typical examples will be illustrated from ferrous and nonferrous alloys. No special techniques are necessary in the making of these microradiographs, which are recorded on industrial fine grain X-ray film, and which are processed and viewed like regular radiographs. A Hilger microfocus unit operated at 45 kv, 250μa, using a Cu target, 40 micron focal spot was employed.Some preliminary results will be illustrated from our application of the divergent beam technique.to single crystals.

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Microtubule nucleation sequence studied by time-resolved x-ray scattering and electron microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100077402 ◽

1983 ◽

Vol 41 ◽

pp. 766-767

Author(s):

Eva-Maria Mandelkow ◽

Eckhard Mandelkow ◽

Joan Bordas

Keyword(s):

Electron Microscopy ◽

Dynamic Equilibrium ◽

Time Resolved ◽

X Ray ◽

Additional Information ◽

X Ray Scattering ◽

Low Concentrations ◽

Microtubule Growth ◽

Ray Patterns ◽

Ray Scattering

When a solution of microtubule protein is changed from non-polymerising to polymerising conditions (e.g. by temperature jump or mixing with GTP) there is a series of structural transitions preceding microtubule growth. These have been detected by time-resolved X-ray scattering using synchrotron radiation, and they may be classified into pre-nucleation and nucleation events. X-ray patterns are good indicators for the average behavior of the particles in solution, but they are difficult to interpret unless additional information on their structure is available. We therefore studied the assembly process by electron microscopy under conditions approaching those of the X-ray experiment. There are two difficulties in the EM approach: One is that the particles important for assembly are usually small and not very regular and therefore tend to be overlooked. Secondly EM specimens require low concentrations which favor disassembly of the particles one wants to observe since there is a dynamic equilibrium between polymers and subunits.

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