XRMF applications of a monolithic, polycapillary, focusing x-ray optic

1996 ◽  
Vol 54 ◽  
pp. 240-241
Author(s):  
D. A. Carpenter ◽  
Ning Gao ◽  
G. J. Havrilla
Keyword(s):  
Trace Elements ◽  
Point Source ◽  
Focal Spot ◽  
Fluorescence Analysis ◽  
X Rays ◽  
Focal Distance ◽  
Spot Diameter ◽  
X Ray ◽  
Focal Spot Diameter

A monolithic, polycapillary, x-ray optic was adapted to a laboratory-based x-ray microprobe to evaluate the potential of the optic for x-ray micro fluorescence analysis. The polycapillary was capable of collecting x-rays over a 6 degree angle from a point source and focusing them to a spot approximately 40 µm diameter. The high intensities expected from this capillary should be useful for determining and mapping minor to trace elements in materials. Fig. 1 shows a sketch of the capillary with important dimensions.The microprobe had previously been used with straight and with tapered monocapillaries. Alignment of the monocapillaries with the focal spot was accomplished by electromagnetically scanning the focal spot over the beveled anode. With the polycapillary it was also necessary to manually adjust the distance between the focal spot and the polycapillary.The focal distance and focal spot diameter of the polycapillary were determined from a series of edge scans.

An x-ray microprobe based upon a close-coupled focal-spot / glass capillary arrangement

1992 ◽  
Vol 50 (2) ◽  
pp. 1758-1759
Author(s):  
D. A. Carpenter ◽  
M. A. Taylor
Keyword(s):  
Imaging Techniques ◽  
Fluorescence Analysis ◽  
High Sensitivity ◽  
Specimen Preparation ◽  
X Rays ◽  
Glass Capillary ◽  
Close Coupling ◽  
X Ray ◽  
Point To Point ◽  
Beam Damage

The development of intense sources of x rays has led to renewed interest in the use of microbeams of x rays in x-ray fluorescence analysis. Sparks pointed out that the use of x rays as a probe offered the advantages of high sensitivity, low detection limits, low beam damage, and large penetration depths with minimal specimen preparation or perturbation. In addition, the option of air operation provided special advantages for examination of hydrated systems or for nondestructive microanalysis of large specimens.The disadvantages of synchrotron sources prompted the development of laboratory-based instrumentation with various schemes to maximize the beam flux while maintaining small point-to-point resolution. Nichols and Ryon developed a microprobe using a rotating anode source and a modified microdiffractometer. Cross and Wherry showed that by close-coupling the x-ray source, specimen, and detector, good intensities could be obtained for beam sizes between 30 and 100μm. More importantly, both groups combined specimen scanning with modern imaging techniques for rapid element mapping.

Control of trace elements content in solid-phase extraction sorbent by x-ray fluorescence analysis

2020 ◽  
Author(s):  
E. V. Kochergina ◽  
A. O. Vagina ◽  
A. O. Taukin ◽  
A. V. Abramov ◽  
G. M. Bunkov ◽  
...  
Keyword(s):  
Trace Elements ◽  
Solid Phase Extraction ◽  
Solid Phase ◽  
Fluorescence Analysis ◽  
Phase Extraction ◽  
X Ray

How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF

1988 ◽  
Vol 32 ◽  
pp. 105-114 ◽  
Author(s):  
H. Schwenke ◽  
W. Berneike ◽  
J. Knoth ◽  
U. Weisbrod
Keyword(s):  
Thin Films ◽  
Penetration Depth ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Characteristic Features ◽  
Respective Characteristic ◽  
Nanometer Regime ◽  
Sensitive Method

AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.

X-ray Microscopy in your Lab

2013 ◽  
Vol 21 (2) ◽  
pp. 7-7
Author(s):  
Charles Lyman
Keyword(s):  
Grain Size ◽  
Point Source ◽  
Visible Light ◽  
Light Microscope ◽  
Construction Materials ◽  
X Rays ◽  
X Ray ◽  
Projection Images ◽  
Straight Lines

Using X rays to produce magnified images of objects has been a goal for 150 years. Ever since Ernst Abbe declared in 1873 that light microscope resolution was limited by the wavelength of light, the search was on for a microscopy medium with a wavelength shorter than visible light (<500 nm). When Roentgen discovered X rays in 1895, it was thought that the new medium may have been found. Soon it was clear, however, that it was not easy to construct a physical lens for X rays because the rays penetrated all lens construction materials. X-ray “radiography images” of a few times magnification were possible but only as projection images, formed as X rays from millimeter-sized sources traveled in straight lines through the specimen to be captured on film. Unfortunately, even in the best cases, useful magnification was limited by the relatively large “point source” of X rays and the large grain size of X-ray film (both about 0.1–1.0 mm).

Slope-Ratio Technique for the Determination of Trace Elements by X-Ray Spectroscopy: A New Approach to Matrix Problems

1968 ◽  
Vol 22 (4) ◽  
pp. 321-324 ◽  
Author(s):  
Frank Cuttitta ◽  
Harry J. Rose
Keyword(s):  
Trace Elements ◽  
Matrix Effects ◽  
Fluorescence Analysis ◽  
Slope Ratio ◽  
New Approach ◽  
X Ray ◽  
Standard Curve ◽  
Residual Matrix ◽  
Matrix Problems

A new approach to solving matrix problems in x-ray fluorescence analysis of trace elements has been applied to the determination of bromine in saline waters and zinc in silicates. The method requires no prior knowledge of the chemical composition of the sample. Marked matrix effects are minimized by dilution, and the problem of variable backgrounds due to residual matrix effects is solved by using a slope-ratio technique. In this proposed technique, the slope of a standard curve prepared from pure solutions is compared with that of spiked samples. The ratio of the slopes of these two curves permits the calculation of an adjusted background which does not significantly differ from that of an absorbent impregnated with the sample matrix free of the element sought. Experimental parameters concerning the technique are presented. The excellent agreement of the zinc and bromine data with analytical results obtained by more conventional methods suggests that the technique can be used for the determination of other trace constituents in geologic materials. Application of the slope-ratio technique to other modes of instrumental analysis appears feasible.

F13 Fundamental Parameter Method Using Scattering X-rays in X-ray Fluorescence Analysis

2005 ◽  
Vol 20 (2) ◽  
pp. 183-183
Author(s):  
Y. Kataoka ◽  
N. Kawahara ◽  
S. Hara ◽  
Y. Yamada ◽  
T. Matsuo ◽  
...  
Keyword(s):  
Fluorescence Analysis ◽  
Parameter Method ◽  
Fundamental Parameter ◽  
X Rays ◽  
X Ray ◽  
Fundamental Parameter Method

Rapid Quantitative Analysis by X-Ray Spectrometry

1971 ◽  
Vol 15 ◽  
pp. 164-175 ◽  
Author(s):  
Robert D. Giauque ◽  
Joseph M. Jaklevic
Keyword(s):  
Cross Sections ◽  
Fluorescence Analysis ◽  
Selective Excitation ◽  
Single Element ◽  
X Rays ◽  
Analysis Method ◽  
Yield Data ◽  
X Ray ◽  
Minimum Number ◽  
Sample Dilution

An x-ray fluorescence analysis method applicable to the case of fluorescent spectra excited with monoenergetic x-rays has been developed. The technique employs a minimum number of calibration steps using single element thin film standards and depends upon theoretical cross sections and fluorescent yield data to interpolate from element to element. The samples are treated as thin films and corrections for absorption effects are easily determined- Enhancement effects, if not negligible, are minimized by sample dilution techniques or by selective excitation.

Rapid Photon-Excited Energy-Dispersive X-Ray Fluorescence Analysis for Solid and Liquid Mineralogical Samples

1975 ◽  
Vol 19 ◽  
pp. 267-272 ◽  
Author(s):  
W. Ratyński ◽  
J. Parus ◽  
J. Tys ◽  
A. Ciszek
Keyword(s):  
Fluorescence Analysis ◽  
Semiconductor Detectors ◽  
X Rays ◽  
Copper Ore ◽  
X Ray ◽  
Large Numbers ◽  
Important Benefit ◽  
Versatile Tool ◽  
On Line ◽  
Set Up

X-ray fluorescence spectroscopy is new becoming a tool in research and. industry. Semiconductor detectors are proving valuable in measuring fluorescent X rays, and so are providing a versatile tool for rapid multielement analysis of many types of samples. This paper will mainly be concerned with, different types of copper ore. An experimental setup has been designed to determine Cu, Fe and Pb of concentration ranging from 0.1 to 20, to 5, and to 4 percent, respectively, with analytical precision of 20% relative at 0.1% Cu, and 3% relative at 20% Cu. For excitation a 100 mCi Pu-238 source and/or a low power air-cooled X-ray tube were used. Data acquisition and “on-line” evaluation for each sample takes about 100 seconds. Electronics blocks and sub-systems used In the set-up are available commercially. The most important benefit to be obtained from the setup is the ability to provide precise, reproducible determinations of large numbers of samples day after day.

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