Study of the Precision of X-ray Stress Analysis

1976 ◽  
Vol 20 ◽  
pp. 291-307 ◽  
Author(s):  
M. R. James ◽  
J. B. Cohen
Keyword(s):  
Residual Stress ◽  
Total Error ◽  
Computer Control ◽  
Systematic Errors ◽  
Automated System ◽  
Sensitive Detector ◽  
Diffraction Profile ◽  
X Ray ◽  
Counting Strategy ◽  
Position Sensitive

Software is described for complete computer control of residual stress measurements. One program (that incorporates either the two tilt method, the sins| procedure, or the Cohen-Marion technique) has been developed for use with either a normal detector or a position sensitive detector. The operator inputs the desired error in stress and various instrumental parameters that determine systematic errors. The counting strategy to obtain the total error is then determined by the software.Employing this automated system, an investigation of a parabolic fit to the top of a diffraction profile indicates that a three point fit is satisfactory only for sharp profiles.

A Versatile X-Ray Stress Analyzer Using a Position Sensitive Detector

1980 ◽  
Vol 24 ◽  
pp. 149-153
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
Counter Method ◽  
X Ray ◽  
Stress Measurements ◽  
Position Sensitive ◽  
Time Required ◽  
Film Method

Instrumentation for X-ray stress analysis has been advanced rapidly in the last few years. Especially, the time required for data accumulation has been remarkably reduced without motion of the detector by using a new X-ray detector called a position sensitive detector (PSD). Applications of PSD to the field of X-ray stress analysis were carried out by James and Cohen, Ruud and Barrett, and the authors. In our laboratory, several position sensitive proportional counters (PSPCs) were designed and manufactured for residual stress measurements. Results show that the PSPC method is a powerful alternative to the conventional counter method or the film method.This paper reports a design of a versatile PSPC X-ray stress analyzer for use in industry and the laboratory.

Stress Measurement in Stainless Steel by use of Monochromatic Cr-Kβ X-Rays and a Position Sensitive Detector

1980 ◽  
Vol 24 ◽  
pp. 167-172 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Residual Stress ◽  
Stainless Steel ◽  
Stress Measurement ◽  
Diffraction Peak ◽  
X Rays ◽  
High Contrast ◽  
Sensitive Detector ◽  
X Ray ◽  
Position Sensitive ◽  
Martensite Structure

X-ray stress analysis in austenltic stainless steel is generally carried out on the ϒFe(311) diffraction line produced by Cr- Kβ X-rays. However, it is often pointed out that not much reliance can be placed on the precision of the stress because the contrast between a diffraction peak and its background is poor. In addition, to measure the stress is sometimes impossible on a specimen which has martensite structure produced by thes train induced transformation, because the ϒFe(211) line appears in the neighborhood of the desired ϒFe(311) line, since Cr-K6 X-rays accompany Cr-Ka from a conventional X-ray source. If Cr-Ka X-rays can be eliminated and only Cr-KB X-rays directed on the specimen, only the λe(311) line with high contrast will be obtained and one can expect to measure the residual stress with high precision.

X-Ray Stress Measurements in Ground Surface of Steel by Position Sensitive Detector

1980 ◽  
Vol 24 ◽  
pp. 181-185 ◽  
Author(s):  
M. Kawata ◽  
M. Morinaga ◽  
Y. Yoshioka
Keyword(s):  
Residual Stress ◽  
Ground Surface ◽  
Carbon Steels ◽  
Sensitive Detector ◽  
Medium Carbon ◽  
X Ray ◽  
Cylindrical Grinding ◽  
Medium Carbon Steels ◽  
Grinding Conditions ◽  
Position Sensitive

AbstractThe residual stress produced by surface and cylindrical grinding was measured by a position sensitive proportional counter. In medium carbon steels the residual stress depends largely on the grinding conditions. For a gentle cylindrical grinding compressive stress was observed, but for a rough grinding tensile stress was present in the workpiece.

Control of the phase composition of advanced calcium phosphates using an x-ray diffractometer with a curved position-sensitive detector

2020 ◽  
Vol 86 (6) ◽  
pp. 29-35
Author(s):  
V. P. Sirotinkin ◽  
O. V. Baranov ◽  
A. Yu. Fedotov ◽  
S. M. Barinov
Keyword(s):  
Phase Composition ◽  
Calcium Phosphates ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray Diffraction ◽  
X Ray ◽  
Impurity Phases ◽  
Position Sensitive ◽  
Diffraction Peaks ◽  
Diffraction Patterns

The results of studying the phase composition of advanced calcium phosphates Ca10(PO4)6(OH)2, β-Ca3(PO4)2, α-Ca3(PO4)2, CaHPO4 · 2H2O, Ca8(HPO4)2(PO4)4 · 5H2O using an x-ray diffractometer with a curved position-sensitive detector are presented. Optimal experimental conditions (angular positions of the x-ray tube and detector, size of the slits, exposure time) were determined with allowance for possible formation of the impurity phases during synthesis. The construction features of diffractometers with a position-sensitive detector affecting the profile characteristics of x-ray diffraction peaks are considered. The composition for calibration of the diffractometer (a mixture of sodium acetate and yttrium oxide) was determined. Theoretical x-ray diffraction patterns for corresponding calcium phosphates are constructed on the basis of the literature data. These x-ray diffraction patterns were used to determine the phase composition of the advanced calcium phosphates. The features of advanced calcium phosphates, which should be taken into account during the phase analysis, are indicated. The powder of high-temperature form of tricalcium phosphate strongly adsorbs water from the environment. A strong texture is observed on the x-ray diffraction spectra of dicalcium phosphate dihydrate. A rather specific x-ray diffraction pattern of octacalcium phosphate pentahydrate revealed the only one strong peak at small angles. In all cases, significant deviations are observed for the recorded angular positions and relative intensity of the diffraction peaks. The results of the study of experimentally obtained mixtures of calcium phosphate are presented. It is shown that the graphic comparison of experimental x-ray diffraction spectra and pre-recorded spectra of the reference calcium phosphates and possible impurity phases is the most effective method. In this case, there is no need for calibration. When using this method, the total time for analysis of one sample is no more than 10 min.

An XRPD Investigation of a Face-Centered Cubic Metallic Plating

1986 ◽  
Vol 1 (2) ◽  
pp. 22-27 ◽  
Author(s):  
Clay Olaf Ruud ◽  
Robin J. McDowell ◽  
Daniel J. Snoha
Keyword(s):  
Residual Stress ◽  
Elastic Strain ◽  
Intensity Variation ◽  
Face Centered Cubic ◽  
Nickel Plating ◽  
Polycrystalline Nickel ◽  
X Ray ◽  
Position Sensitive ◽  
Face Centered ◽  
Crystallographic Planes

AbstractInternal elastic strain (i.e., residual stress) and the diffracted X-ray intensity variation over several orientations of crystallites with respect to the specimen surface were investigated as a means of differentiating two qualities of polycrystalline nickel plating. A unique instrument based upon a position-sensitive scintillation X-ray detector was used to apply all of the techniques commonly applied to X-ray stress analysis in this investigation. It was concluded that residual stress measurements did not provide a clear distinction between the two specimens, but comparison of the relative intensities diffracted from crystallographic planes at certain orientations with the surface did provide a distinction.

Temperature-gradient analyzers for non-resonant inelastic X-ray scattering

2021 ◽  
Vol 28 (3) ◽  
Author(s):  
Daisuke Ishikawa ◽  
Alfred Q. R. Baron
Keyword(s):  
Temperature Gradient ◽  
Solid Angle ◽  
Dispersion Compensation ◽  
Full Width ◽  
Half Maximum ◽  
Sensitive Detector ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
And Performance

The detailed fabrication and performance of the temperature-gradient analyzers that were simulated by Ishikawa & Baron [(2010). J. Synchrotron Rad. 17, 12–24] are described and extended to include both quadratic and 2D gradients. The application of a temperature gradient compensates for geometric contributions to the energy resolution while allowing collection of a large solid angle, ∼50 mrad × 50 mrad, of scattered radiation. In particular, when operating relatively close to backscattering, π/2 − θB = 1.58 mrad, the application of a gradient of 1.32 K per 80 mm improves the measured total resolution from 60 to 25 meV at the full width at half-maximum, while when operating further from backscattering, π/2 − θB = 6.56 mrad, improvement from 330 to 32 meV is observed using a combination of a gradient of 6.2 K per 80 mm and dispersion compensation with a position-sensitive detector. In both cases, the operating energy was 15.8 keV and the incident bandwidth was 22 meV. Notably, the use of a temperature gradient allows a relatively large clearance at the sample, permitting installation of more complicated sample environments.

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