A Versatile X-Ray Stress Analyzer Using a Position Sensitive Detector

1980 ◽  
Vol 24 ◽  
pp. 149-153
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Residual Stress ◽  
Stress Analysis ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
Counter Method ◽  
X Ray ◽  
Stress Measurements ◽  
Position Sensitive ◽  
Time Required ◽  
Film Method

Instrumentation for X-ray stress analysis has been advanced rapidly in the last few years. Especially, the time required for data accumulation has been remarkably reduced without motion of the detector by using a new X-ray detector called a position sensitive detector (PSD). Applications of PSD to the field of X-ray stress analysis were carried out by James and Cohen, Ruud and Barrett, and the authors. In our laboratory, several position sensitive proportional counters (PSPCs) were designed and manufactured for residual stress measurements. Results show that the PSPC method is a powerful alternative to the conventional counter method or the film method.This paper reports a design of a versatile PSPC X-ray stress analyzer for use in industry and the laboratory.

Control of the phase composition of advanced calcium phosphates using an x-ray diffractometer with a curved position-sensitive detector

2020 ◽  
Vol 86 (6) ◽  
pp. 29-35
Author(s):  
V. P. Sirotinkin ◽  
O. V. Baranov ◽  
A. Yu. Fedotov ◽  
S. M. Barinov
Keyword(s):  
Phase Composition ◽  
Calcium Phosphates ◽  
Position Sensitive Detector ◽  
Sensitive Detector ◽  
X Ray Diffraction ◽  
X Ray ◽  
Impurity Phases ◽  
Position Sensitive ◽  
Diffraction Peaks ◽  
Diffraction Patterns

The results of studying the phase composition of advanced calcium phosphates Ca10(PO4)6(OH)2, β-Ca3(PO4)2, α-Ca3(PO4)2, CaHPO4 · 2H2O, Ca8(HPO4)2(PO4)4 · 5H2O using an x-ray diffractometer with a curved position-sensitive detector are presented. Optimal experimental conditions (angular positions of the x-ray tube and detector, size of the slits, exposure time) were determined with allowance for possible formation of the impurity phases during synthesis. The construction features of diffractometers with a position-sensitive detector affecting the profile characteristics of x-ray diffraction peaks are considered. The composition for calibration of the diffractometer (a mixture of sodium acetate and yttrium oxide) was determined. Theoretical x-ray diffraction patterns for corresponding calcium phosphates are constructed on the basis of the literature data. These x-ray diffraction patterns were used to determine the phase composition of the advanced calcium phosphates. The features of advanced calcium phosphates, which should be taken into account during the phase analysis, are indicated. The powder of high-temperature form of tricalcium phosphate strongly adsorbs water from the environment. A strong texture is observed on the x-ray diffraction spectra of dicalcium phosphate dihydrate. A rather specific x-ray diffraction pattern of octacalcium phosphate pentahydrate revealed the only one strong peak at small angles. In all cases, significant deviations are observed for the recorded angular positions and relative intensity of the diffraction peaks. The results of the study of experimentally obtained mixtures of calcium phosphate are presented. It is shown that the graphic comparison of experimental x-ray diffraction spectra and pre-recorded spectra of the reference calcium phosphates and possible impurity phases is the most effective method. In this case, there is no need for calibration. When using this method, the total time for analysis of one sample is no more than 10 min.

Study of the Precision of X-ray Stress Analysis

1976 ◽  
Vol 20 ◽  
pp. 291-307 ◽  
Author(s):  
M. R. James ◽  
J. B. Cohen
Keyword(s):  
Residual Stress ◽  
Total Error ◽  
Computer Control ◽  
Systematic Errors ◽  
Automated System ◽  
Sensitive Detector ◽  
Diffraction Profile ◽  
X Ray ◽  
Counting Strategy ◽  
Position Sensitive

Software is described for complete computer control of residual stress measurements. One program (that incorporates either the two tilt method, the sins| procedure, or the Cohen-Marion technique) has been developed for use with either a normal detector or a position sensitive detector. The operator inputs the desired error in stress and various instrumental parameters that determine systematic errors. The counting strategy to obtain the total error is then determined by the software.Employing this automated system, an investigation of a parabolic fit to the top of a diffraction profile indicates that a three point fit is satisfactory only for sharp profiles.

Defect structure analysis of polycrystalline materials by computer-controlled double-crystal diffractometer with position-sensitive detector

1983 ◽  
Vol 16 (1) ◽  
pp. 89-95 ◽  
Author(s):  
R. Yazici ◽  
W. Mayo ◽  
T. Takemoto ◽  
S. Weissmann
Keyword(s):  
Position Sensitive Detector ◽  
Polycrystalline Materials ◽  
Sensitive Detector ◽  
Double Crystal ◽  
Rocking Curve ◽  
X Ray ◽  
Local Lattice ◽  
Position Sensitive ◽  
The Individual ◽  
Double Crystal Diffractometer

The method represents an extension of a previously developed X-ray double-crystal diffractometer method when a film was used to record the crystallite reflections, each reflecting crystallite being regarded as the second crystal of a double-crystal diffractometer. By utilizing a position-sensitive detector (PSD) with interactive computer controls, the tedious and limiting task of data acquisition and analysis is greatly simplified. The specimen is irradiated with crystal-monochromated radiation and the numerous microscopic spots emanating from the reflecting crystallites are recorded separately by the position-sensitive detector and its associated multichannel analyzer at each increment of specimen rotation. An on-line minicomputer simultaneously collects these data and applies the necessary corrections. This process is then automatically repeated through the full rocking-curve range. The computer carries out the rocking-curve analysis of the individual crystallite reflections as well as that of the entire reflecting crystallite population. The instrument is provided with a specimen translation device which permits analysis of large sections of solid specimens. Thus, sites of local lattice defects induced either mechanically, chemically or by radiation can rapidly be established and quantitatively determined in terms of rocking-curve parameters as well as imaged by X-ray topography, by inserting a film in front of the PSD. The versatility and usefulness of the method is demonstrated by examples given from studies of fracture, fatigue and stress-corrosion cracking of commercial alloys.

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