Synchrotron Radiation X-Ray Fluorescence Analysis with a Crystal Spectrometer

1991 ◽  
Vol 35 (B) ◽  
pp. 1027-1033 ◽  
Author(s):  
Kazutaka Ohashi ◽  
Mamoru Takahashl ◽  
Yohichi Gohshi ◽  
Atsuo Iida ◽  
Shunji Eishimoto
Keyword(s):  
Synchrotron Radiation ◽  
High Efficiency ◽  
Fluorescence Analysis ◽  
High Energy ◽  
Small Samples ◽  
High Energy Resolution ◽  
Present System ◽  
High Brightness ◽  
X Ray ◽  
Position Sensitive

AbstractA wavelength dispersive spectrometer which consists of a flat crystal analyser and a position sensitive proportional counter has been developed for X-ray fluorescence analysis using synchrotron radiation. The advantages of this spectrometer are high energy resolution, multielemental nature, and high efficiency, and these match well "with the high brightness synchrotron X-ray source. The minimum detection limits are of the order of ppm or pg. An application to elemental mapping has also been demonstrated. The present system is useful for practical analysis of small samples or small regions.

X‐ray fluorescence analysis with high energy resolution

1996 ◽  
Vol 67 (9) ◽  
pp. 3359-3359 ◽  
Author(s):  
Wolfgang A. Caliebe ◽  
Sas̆a Bajt ◽  
Chi‐Chang Kao
Keyword(s):  
Energy Resolution ◽  
Fluorescence Analysis ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray

Micro-X-Ray Fluorescence Analysis on a Synchrotron Radiation Wiggler Beam Line

1991 ◽  
Vol 35 (B) ◽  
pp. 995-1000
Author(s):  
J.V. Gilfrich ◽  
E.F. Skelton ◽  
S.B. Qadri ◽  
N.E. Moulton ◽  
D.J. Nagel ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
National Laboratory ◽  
Incident Beam ◽  
Fluorescence Analysis ◽  
High Energy ◽  
Brookhaven National Laboratory ◽  
Beam Line ◽  
X Rays ◽  
X Ray ◽  
Electron Orbit

AbstractIt has been well established over recent years that synchrotron radiation possesses some unique features as a source of primary x-rays for x-ray fluorescence analysis. Advantage has been taken of the high intensity emanating from the bending magnets of storage rings to develop x-ray microprobes utilizing apertures or focussing optics, or both, to provide a beam spot at the specimen of the order of micrometers. The use of insertion devices wigglers and undulatora, can further increase the available intensity, especially for the high energy photons. Beam Line X-17C at the National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory, accepts the unmodified continuum radiation from a superconducting wiggler in the storage ring. Some initial XRF measurements have been made on this beam line using apertures in the 10 to 100 micrometer range. The fluorescent radiation was measured by an intrinsic Ge detector having an energy resolution of 300 eV at 15 kev, and located at 90° to the incident beam in the plane of the electron orbit. In samples containing many elements, detection limits of a few ppm were achieved with 100 μm beams.

scholarly journals High-efficiency ultra-precision comparator for d-spacing mapping measurement of silicon

2020 ◽  
Vol 27 (3) ◽  
pp. 577-582 ◽  
Author(s):  
Junliang Yang ◽  
Tang Li ◽  
Ye Zhu ◽  
Xiaowei Zhang ◽  
Atsushi Waseda ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
High Efficiency ◽  
Photon Counting ◽  
Pencil Beam ◽  
Systematic Deviation ◽  
One Dimensional ◽  
X Ray ◽  
Experimental Configuration ◽  
Ultra Precision ◽  
Position Sensitive

This article describes a high-efficiency experimental configuration for a self-referenced lattice comparator with a `brush beam' of synchrotron radiation from a bending magnet and two linear position-sensitive photon-counting-type X-ray detectors. The efficiency is more than ten times greater compared with the `pencil-beam' configuration and a pair of zero-dimensional detectors. A solution for correcting the systematic deviation of d-spacing measurements caused by the horizontal non-uniformity of the brush beam is provided. Also, the use of photon-counting-type one-dimensional detectors not only improves the spatial resolution of the measurements remarkably but can also adjust the sample's attitude angles easily.

Mechanical aspects of the ID26 emission spectrometer II: improving stability for a large instrument by the use of multiple air pad supports

2010 ◽  
Vol 1 (MEDSI-6) ◽  
Author(s):  
L. Ducotté ◽  
P. Glatzel ◽  
P. Marion ◽  
C. Lapras ◽  
M. Lesourd ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Vertical Plane ◽  
Vertical Axis ◽  
High Energy ◽  
Perfect Crystal ◽  
European Synchrotron Radiation Facility ◽  
High Energy Resolution ◽  
X Ray ◽  
Radiation Sources ◽  
Almost All

An instrument for X-ray emission spectroscopy (XES) based on perfect crystal Bragg optics was recently commissioned at beam line ID26 of the ESRF (European Synchrotron Radiation Facility). The spectrometer is used to record high-energy resolution fluorescence-detected X-ray absorption spectra with sub-lifetime resolution and to perform resonant and non-resonant XES. The hard X-ray probe is material bulk sensitive and allows demanding sample environments (in situ chemistry, high pressure, etc.). Spectrometers for XES are being installed or designed at almost all upcoming synchrotron radiation sources worldwide. The particularity of the ID26 spectrometer is to accommodate five analyser crystals with exact Rowland tracking in the vertical plane and with crystals radii between 0.5 and 2 m.The main upgrade of the new version of this large instrument (3 tonnes, overall size 2.5 m and height 3 m) is to allow the change of the scattering angle over the range 0–180°. This involves rotating the entire spectrometer around a vertical axis that passes through the sample. In order to optimize the vibration stability of the spectrometer's structure, we chose to support the structure in multiple points and not only on three (kinematic mount) like it is specified to do with air pads. According to this choice, we have developed special foot holders for air pads.The calculations during the design phase have shown that we can obtain a first modal frequency of the spectrometer's structure at more than 30 Hz. To confirm our predictive calculations, we have performed some vibration measurements.

Performance of a high‐energy‐resolution, tender x‐ray synchrotron radiation beamline (invited)

1989 ◽  
Vol 60 (7) ◽  
pp. 1603-1607 ◽  
Author(s):  
P. L. Cowan ◽  
S. Brennan ◽  
T. Jach ◽  
D. W. Lindle ◽  
B. A. Karlin
Keyword(s):  
Synchrotron Radiation ◽  
Energy Resolution ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray
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