Separation of Kα Doublet for Profile Analysis by Use of FFT
Keyword(s):
X Ray
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Line-profile analysis is important for material evaluation as well as x-ray stress analysis. In the general case, the half-value breadth of the Kα doublet is used as the line-profile parameter, but it is preferable to use the half-value breadth of the Kα1 diffraction profile because of high resolution.
2006 ◽
Vol 2006
(suppl_23_2006)
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pp. 129-134
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1993 ◽
Vol 85
(4)
◽
pp. 307-310
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Keyword(s):
2003 ◽
Vol 60
(6)
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pp. 919-922
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