Fourier synthesis image reconstruction by use of one-dimensional position-sensitive detectors

2003 ◽  
Vol 42 (20) ◽  
pp. 4176 ◽  
Author(s):  
Jun′ichi Kotoku ◽  
Kazuo Makishima ◽  
Yuu Okada ◽  
Hitoshi Negoro ◽  
Yukikatsu Terada ◽  
...  
Keyword(s):  
Image Reconstruction ◽  
Fourier Synthesis ◽  
One Dimensional ◽  
Position Sensitive ◽  
Position Sensitive Detectors

Stress Measurements with a Two-Dimensional Real-Time System

1988 ◽  
Vol 32 ◽  
pp. 397-406 ◽  
Author(s):  
G.M. Borgonovi ◽  
C.P. Gazza
Keyword(s):  
Two Dimensional ◽  
Single Exposure ◽  
Time System ◽  
Real Time System ◽  
One Dimensional ◽  
Potential Source ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Exposure Technique

Conventional methods of determination of residual stress in polycrystalline samples use either diffractometers or one-dimensional position-sensitive detectors. The most commonly used technique, the so-called "sin2ψ" method, requires several measurements at different angular positions of the sample. With diffractometers, two rotations are required, while with one-dimensional detectors, one rotation is required (except for the so-called single exposure technique, which requires two one-dimensional position-sensitive detectors). Rotation can be a potential source of errors if the sample is not aligned very carefully.

PSD Sensor Decomposing Multiple Light Spots

2006 ◽  
Vol 18 (1) ◽  
pp. 97-102 ◽  
Author(s):  
Susumu Kouno ◽  
Keyword(s):  
High Speed ◽  
One Dimensional ◽  
Psd Sensor ◽  
Working Principle ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Speed Response

Position-sensitive detectors (PSDs) detect light spots point and total lights focused on it. The PSD provides high-speed response and precision due to its simple working principle. Inexpensive one-dimensional (1D) PSDs are commercially available, but when multiple lights focus on the PSD, it can only the center of multiple light positions making it unable to detect individual light positions separately. We propose a sensor that breaks down multiple light spots individua1ys by combing the rotation of a polygon mirror and two 1D PSDs. We consider how many light spots is broken down. We designed and developed a PSD sensor consisting of two 1D PSDs, a polygon mirror, and an actuator for rotating the polygon mirror. We broke down multiple light spots into individuals in scanning at 50.8Hz.

Insights on Amorphous Silicon Nip and MIS 3D Position Sensitive Detectors

2006 ◽  
Vol 514-516 ◽  
pp. 13-17 ◽  
Author(s):  
Rodrigo Martins ◽  
Daniel Costa ◽  
Hugo Águas ◽  
Fernanda Soares ◽  
António Marques ◽  
...  
Keyword(s):  
Amorphous Silicon ◽  
Image Resolution ◽  
Mis Structure ◽  
Silicon Thin Film ◽  
One Dimensional ◽  
Operation Conditions ◽  
Plane Image ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Better Than

This work aims to report results of the spatial and frequency optical detection limits of integrated arrays of 32 one-dimensional amorphous silicon thin film position sensitive detectors with nip or MIS structure, under continuous and pulsed laser operation conditions. The arrays occupy a total active area of 45 mm2 and have a plane image resolution better than 15 m with a cut-off frequency of about 6.8 kHz. The non-linearity of the array components varies with the frequency, being about 1.6% for 200 Hz and about 4% for the cut-off frequency (6.8 kHz).

Analysis of front contact heterojunction in a-Si:H one-dimensional position sensitive detectors

1997 ◽  
Vol 68 (3) ◽  
pp. 1377-1381 ◽  
Author(s):  
M. Topič ◽  
F. Smole ◽  
J. Furlan ◽  
E. Fortunato ◽  
R. Martins
Keyword(s):  
One Dimensional ◽  
Position Sensitive ◽  
Position Sensitive Detectors

MOS-Type One-Dimensional Position-Sensitive Detectors with a Linearly Detectable Face of 30 mm Long

1991 ◽  
Vol 30 (Part 1, No. 4) ◽  
pp. 637-638
Author(s):  
Yoshihiro Matsubara ◽  
Toshiya Kodai ◽  
Haruhiko Yoshida ◽  
Hirohiko Niu ◽  
Tetsuro Matsuda ◽  
...  
Keyword(s):  
One Dimensional ◽  
Position Sensitive ◽  
Position Sensitive Detectors

Design of a Real-Time Two-Dimensional Residual Stress Analyzer

1986 ◽  
Vol 30 ◽  
pp. 523-526
Author(s):  
G. M. Borgonovi
Keyword(s):  
Residual Stress ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Detector Plane ◽  
Flat Detector ◽  
One Dimensional ◽  
X Ray ◽  
State Of Stress ◽  
Position Sensitive ◽  
Position Sensitive Detectors

Measurements of residual stress by X-ray diffraction are usually carried out with diffractometers or with one-dimensional position sensitive detectors. The stress is determined from the displacement of the peak that results from intersecting a diffraction cone at high angle with the line scanned by the detector. If a two-dimensional flat detector is used, the intersection of the diffraction cone with the detector plane is a ring, or section of a ring, which is also slightly displaced by the stress. The suggestion has been made use a two-dimensional detector to determine the surface state of stress.

From Intelligent Materials to Smart Sensors: a-Si:H Position Sensitive Detectors

1996 ◽  
Vol 420 ◽  
Author(s):  
E. Fortunato ◽  
M. Fernandes ◽  
F. Soares ◽  
G. Lavareda ◽  
R. Martins
Keyword(s):  
Smart Sensors ◽  
Detection Accuracy ◽  
One Dimensional ◽  
Continuous Quality ◽  
Optical Inspection ◽  
Inspection Systems ◽  
Dynamic Performances ◽  
Position Sensitive ◽  
Position Sensitive Detectors ◽  
Better Than

AbstractThis work presents the main static and dynamic performances showed by one dimensional thin film position sensitive detectors (ID TFPSD), based on a-Si:H technology, with a size of 80 mm × 5 mm. The results obtained show that the TFPSD is able to respond to light powers as low as 2μ W/cm2, presenting a detection accuracy, linearity and response frequency better than 10 gm, 2% and 2 KHz, respectively. These results are quite promising regarding the application of these sensors to a wide variety of optical inspection systems where continuous quality control is required.

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