scholarly journals Homogeneous Hyperbolic Systems for Terahertz and Far-Infrared Frequencies

2012 ◽  
Vol 2012 ◽  
pp. 1-6 ◽  
Author(s):  
Leonid V. Alekseyev ◽  
Viktor A. Podolskiy ◽  
Evgenii E. Narimanov

We demonstrate that homogeneous naturally-occurring materials can form hyperbolic media, and can be used for nonmagnetic negative refractive index systems. We present specific realizations of the proposed approach for the THz and far-IR frequencies. The proposed structures operate away from resonance, thereby promising the capacity for low-loss devices.

2010 ◽  
Vol 02 (02) ◽  
pp. 104-110 ◽  
Author(s):  
Y.J. Huang ◽  
G.J. Wen ◽  
T.Q. Li ◽  
K. Xie

2012 ◽  
Vol 100 (15) ◽  
pp. 151104 ◽  
Author(s):  
Andreas Rottler ◽  
Malte Harland ◽  
Markus Bröll ◽  
Stephan Schwaiger ◽  
Daniel Stickler ◽  
...  

2018 ◽  
Vol 26 (7) ◽  
pp. 8314 ◽  
Author(s):  
Takehito Suzuki ◽  
Masashi Sekiya ◽  
Tatsuya Sato ◽  
Yuki Takebayashi

Sensors ◽  
2021 ◽  
Vol 21 (14) ◽  
pp. 4782
Author(s):  
Srijan Datta ◽  
Saptarshi Mukherjee ◽  
Xiaodong Shi ◽  
Mahmood Haq ◽  
Yiming Deng ◽  
...  

Metamaterials are engineered periodic structures designed to have unique properties not encountered in naturally occurring materials. One such unusual property of metamaterials is the ability to exhibit negative refractive index over a prescribed range of frequencies. A lens made of negative refractive index metamaterials can achieve resolution beyond the diffraction limit. This paper presents the design of a metamaterial lens and its use in far-field microwave imaging for subwavelength defect detection in nondestructive evaluation (NDE). Theoretical formulation and numerical studies of the metamaterial lens design are presented followed by experimental demonstration and characterization of metamaterial behavior. Finally, a microwave homodyne receiver-based system is used in conjunction with the metamaterial lens to develop a far-field microwave NDE sensor system. A subwavelength focal spot of size 0.82λ was obtained. The system is shown to be sensitive to a defect of size 0.17λ × 0.06λ in a Teflon sample. Consecutive positions of the defect with a separation of 0.23λ was resolvable using the proposed system.


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