scholarly journals Lattice Copies ofℓ2inL1of a Vector Measure and Strongly Orthogonal Sequences

2012 ◽  
Vol 2012 ◽  
pp. 1-15
Author(s):  
E. Jiménez Fernández ◽  
E. A. Sánchez Pérez

Letmbe anℓ2-valued (countably additive) vector measure and consider the spaceL2(m) of square integrable functions with respect tom. The integral with respect tomallows to define several notions of orthogonal sequence in these spaces. In this paper, we center our attention in the existence of stronglym-orthonormal sequences. Combining the use of the Kadec-Pelczyński dichotomy in the domain space and the Bessaga-Pelczyński principle in the range space, we construct a two-sided disjointification method that allows to prove several structure theorems for the spacesL1(m) andL2(m). Under certain requirements, our main result establishes that a normalized sequence inL2(m) with a weakly null sequence of integrals has a subsequence that is stronglym-orthonormal inL2(m∗), wherem∗is anotherℓ2-valued vector measure that satisfiesL2(m) = L2(m∗). As an application of our technique, we give a complete characterization of when a space of integrable functions with respect to anℓ2-valued positive vector measure contains a lattice copy ofℓ2.

1994 ◽  
Vol 36 (2) ◽  
pp. 157-161 ◽  
Author(s):  
Jesús M. F. Castilo ◽  
Fernando Sánchez

A long-standing problem is the characterization of subsets of the range of a vector measure. It is known that the range of a countably additive vector measure is relatively weakly compact and, in addition, possesses several interesting properties (see [2]). In [6] it is proved that if m: Σ → Χ is a countably additive vector measure, then the range of m has not only the Banach–Saks property, but even the alternate Banach-Saks property. A tantalizing conjecture, which we shall disprove in this article, is that the range of m has to have, for some p > 1, the p-Banach–Saks property. Another conjecture, which has been around for some time (see [2]) and is also disproved in this paper, is that weakly null sequences in the range of a vector measure admit weakly-2-summable sub-sequences. In fact, we shall show a weakly null sequence in the range of a countably additive vector measure having, for every p < ∞, no weakly-p-summable sub-sequences.


2001 ◽  
Vol 70 (1) ◽  
pp. 10-36
Author(s):  
L. Rodriguez-Piazza ◽  
M. C. Romero-Moreno

AbstractLet X be a locally convex space. Kluvánek associated to each X-valued countably additive vector measure a conical measure on X; this can also be done for finitely additive bounded vector measures. We prove that every conical measure u on X, whose associated zonoform Ku is contained in X, is associated to a bounded additive vector measure σ(u) defined on X, and satisfying σ(u)(H) ∈ H, for every finite intersection H of closed half-spaces. When X is a complete weak space, we prove that σ(u) is countably additive. This allows us to recover two results of Kluvánek: for any X, every conical measure u on it with Ku ⊆ X is associated to a countably additive X-valued vector measure; and every conical measure on a complete weak space is localizable. When X is a Banach space, we prove that σ(u) is countably additive if and only if u is the conical measure associated to a Pettis differentiable vector measure.


2014 ◽  
Vol 2014 ◽  
pp. 1-6
Author(s):  
Xiaona Cui ◽  
Suxia Yao

We consider in this paper expansions of functions based on the rational orthogonal basis for the space of square integrable functions. The basis functions have nonnegative instantaneous frequencies so that the expansions make physical sense. We discuss the almost everywhere convergence of the expansions and develop a fast algorithm for computing the coefficients arising in the expansions by combining the characterization of the coefficients with the fast Fourier transform.


2021 ◽  
Vol 20 ◽  
pp. 8-18
Author(s):  
Levi Otanga Olwamba ◽  
Maurice Oduor

This article is devoted to the study of pointwise product vector measure duality. The properties of Hilbert function space of integrable functions and pointwise sections of measurable sets are considered through the application of integral representation of product vector measures, inner product functions and products of measurable sets.


Author(s):  
A. El Gourari ◽  
A. Ghanmi ◽  
K. Zine

We consider the [Formula: see text]d and [Formula: see text]d bicomplex analogues of the classical Fourier–Wigner transform. Their basic properties, including Moyal’s identity and characterization of their ranges giving rise to new bicomplex–polyanalytic functional spaces are discussed. Details concerning a special window function are developed explicitly. An orthogonal basis for the space of bicomplex-valued square integrable functions on the bicomplex numbers is constructed by means of a specific class of bicomplex Hermite functions.


1982 ◽  
Vol 10 (1) ◽  
pp. 37-54 ◽  
Author(s):  
M. Kumar ◽  
C. W. Bert

Abstract Unidirectional cord-rubber specimens in the form of tensile coupons and sandwich beams were used. Using specimens with the cords oriented at 0°, 45°, and 90° to the loading direction and appropriate data reduction, we were able to obtain complete characterization for the in-plane stress-strain response of single-ply, unidirectional cord-rubber composites. All strains were measured by means of liquid mercury strain gages, for which the nonlinear strain response characteristic was obtained by calibration. Stress-strain data were obtained for the cases of both cord tension and cord compression. Materials investigated were aramid-rubber, polyester-rubber, and steel-rubber.


Author(s):  
G. Meneghesso ◽  
E. Zanoni ◽  
P. Colombo ◽  
M. Brambilla ◽  
R. Annunziata ◽  
...  

Abstract In this work, we present new results concerning electrostatic discharge (ESD) robustness of 0.6 μm CMOS structures. Devices have been tested according to both HBM and socketed CDM (sCDM) ESD test procedures. Test structures have been submitted to a complete characterization consisting in: 1) measurement of the tum-on time of the protection structures submitted to pulses with very fast rise times; 2) ESD stress test with the HBM and sCDM models; 3) failure analysis based on emission microscopy (EMMI) and Scanning Electron Microscopy (SEM).


2019 ◽  
Vol 125 (1) ◽  
pp. 10008 ◽  
Author(s):  
Bat-el Friedman ◽  
Atanu Rajak ◽  
Emanuele G. Dalla Torre

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