scholarly journals Raman Spectroscopy of Amorphous Carbon Prepared by Pulsed Arc Discharge in Various Gas Mixtures

2013 ◽  
Vol 2013 ◽  
pp. 1-6 ◽  
Author(s):  
M. Marton ◽  
M. Vojs ◽  
E. Zdravecká ◽  
M. Himmerlich ◽  
T. Haensel ◽  
...  

To meet various application requirements, it is important to enable an improvement of a-C structure and properties, such as hardness, adhesion, and wear resistance. In this study, we used the Raman spectroscopy to investigate the a-C thin films structure dependence on the different deposition parameters. The effect of nitrogen, argon, and hydrogen gas flow rate was analyzed to determine the influence on the film properties. The change in the gas type, combination, and flow had a significant influence on the D and G bands of the a-C Raman spectra. The addition of N2into the chamber promoted the sp2creation, while with adding hydrogen the layer contained more sp3bonds. The depositions of a-C thin films were carried out in pulsed arc discharge vacuum installation. Micro-Raman measurements of the deposited materials were performed using an ISA Dilor-Jobin Yvon-Spex Labram confocal system with 632.8 nm radiation from a He-Ne laser using a back-scattering geometry.

2007 ◽  
Vol 534-536 ◽  
pp. 1413-1416
Author(s):  
S.Y. Chun ◽  
Chung Hyo Lee ◽  
Sang Jin Lee

TiAl and TiAlN thin films are deposited on glassy carbon and Si substrates by the pulsed cathodic arc deposition process. In our pulsed cathodic arc system, because the spatial position of plasma on the surface of the evaporation source can be controlled by pulsed arc discharge, the thickness of the TiAl and TiAlN films can be controlled at nanometer scale. Amorphous stoichiometric Ti-Al films are synthesized from one Ti-Al alloy target at room temperature by changing the number of pulses of the arc discharge.


2008 ◽  
Vol 17 (12) ◽  
pp. 2071-2074 ◽  
Author(s):  
Veli-Matti Tiainen ◽  
Antti Soininen ◽  
Esa Alakoski ◽  
Yrjö T. Konttinen

2002 ◽  
Vol 30 (5) ◽  
pp. 1993-1998 ◽  
Author(s):  
T. Namihira ◽  
S. Katsuki ◽  
R. Hackam ◽  
H. Akiyama ◽  
K. Okamoto

2013 ◽  
Vol 215-216 ◽  
pp. 45-49 ◽  
Author(s):  
Yongfeng Li ◽  
Qiang Chen ◽  
Kai Xu ◽  
Toshiro Kaneko ◽  
Rikizo Hatakeyama

2017 ◽  
Vol 88 (8) ◽  
pp. 086111
Author(s):  
H. Saghafifar ◽  
M. S. Goodarzi

2003 ◽  
pp. 51-54 ◽  
Author(s):  
Stevan Djenize ◽  
Aleksandar Sreckovic ◽  
Srdjan Bukvic ◽  
Slobodanka Kalezic

Stark widths (W) and shifts (d) of 5 prominent triply ionized oxygen (O IV) spectral lines in 3 multiplets have been measured in oxygen plasma at 42 000 K electron temperature using a linear, low-pressure, pulsed arc discharge as an optically thin plasma source. Obtained W and d values have been compared to available experimental and theoretical data. We found a good agreement among our experimental W and d values and theoretical expectations.


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