scholarly journals Compressed Firmware Classification Based on Extra Trees and Doc2Vec

2021 ◽  
Vol 2021 ◽  
pp. 1-9
Author(s):  
Jing Qiu ◽  
Xiaoxu Geng ◽  
Guanglu Sun
Keyword(s):  
Binary Code ◽  
Careful Analysis ◽  
Arithmetic Mean ◽  
File Size ◽  
Embedded Device ◽  
Analysis Tools

Firmware formats vary from vendor to vendor, making it difficult to track which vendor or device the firmware belongs to, or to identify the firmware used in an embedded device. Current firmware analysis tools mainly distinguish firmware by static signatures in the firmware binary code. However, the extraction of a signature often requires careful analysis by professionals to obtain it and requires a significant investment of time and effort. In this paper, we use Doc2Vec to extract and process the character information in firmware, combine the file size, file entropy, and the arithmetic mean of bytes as firmware features, and implement the firmware classifier by combining the Extra Trees model. The evaluation is performed on 1,190 firmware files from 5 router vendors. The accuracy of the classifier is 97.18%, which is higher than that of current approaches. The results show that the proposed approach is feasible and effective.

scholarly journals DrPin: A dynamic binary instumentator for multiple processor architectures

2020 ◽  
Author(s):  
Luis Fernando Antonioli ◽  
Ricardo Pannain ◽  
Rodolfo Azevedo
Keyword(s):  
Dynamic Analysis ◽  
Static Analysis ◽  
Binary Code ◽  
Binary Analysis ◽  
Linux Kernel ◽  
Processor Architectures ◽  
Backward Compatibility ◽  
Analysis Tools ◽  
Multiple Processor ◽  
Dynamic Binary Analysis

Modern applications rely heavily on dynamically loaded shared libraries, making static analysis tools used to debug and understand applications no longer sufficient. As a consequence, dynamic analysis tools are being adopted and integrated into the development and study of modern applications. Building tools that manipulate and instrument binary code at runtime is difficult and error-prone. Because of that, Dynamic Binary Instrumentation (DBI) frameworks have become increasingly popular. Those frameworks provide means of building dynamic binary analysis tools with low effort. Among them, Pin 2 has been by far the most popular and easy to use one. However, since the release of the Linux Kernel 4 series, it became unsupported, and Pin 3 broke backward compatibility. In this work we focus on studying the challenges faced when building a new DBI (DrPin) that seeks to be compatible with Pin 2 API, without the restrictions of Pin 3, that also runs multiple architectures (x86-64, x86, Arm, Aarch64), and on modern Linux systems.

Analysis of Dark-Field Images of Disordered Materials

1972 ◽  
Vol 30 ◽  
pp. 560-561
Author(s):  
J. M. Cowley
Keyword(s):  
Amorphous Materials ◽  
Careful Analysis ◽  
Dark Field ◽  
Minimum Diameter ◽  
Statistical Fluctuations ◽  
Bright Spots ◽  
Sufficient Detail ◽  
Random Arrangement ◽  
Diffraction Patterns ◽  
Imaging Conditions

Recently a number of authors have reported detail in dark-field images obtained from diffuse-scattering regions of electron diffraction patterns. Bright spots in images from short-range order diffuse peaks of disordered binary alloys have been interpreted as evidence for the existence of microdomains of ordered lattice or of segragated clusters of one component. Spotty contrast in dark field images of near-amorphous materials has been interpreted as evidence for the existense of microcrystals. Without a careful analysis of the imaging conditions such conclusions may be invalid. Usually the conditions of the experiment have not been specified in sufficient detail to allow evaluation of the conclusions.Elementary considerations show that even for a completely random arrangement of atoms the statistical fluctuations of density will give a spotty contrast with spots of minimum diameter determined by the dark field aperture size and other factors influencing the minimum resolvable distance under darkfield imaging conditions, including fluctuations and drift over long exposure times (resolution usually 10Å or more).

Left Ventricular Hypertrophy

2014 ◽  
Vol 19 (2) ◽  
pp. 11-15
Author(s):  
Steven L. Demeter
Keyword(s):  
Risk Factors ◽  
Left Ventricular Hypertrophy ◽  
Ventricular Hypertrophy ◽  
Left Ventricular Mass Index ◽  
Medical Science ◽  
Careful Analysis ◽  
Left Ventricular ◽  
Hypertensive Disease ◽  
Accurate Analysis ◽  
Clear Explanation

Abstract The fourth, fifth, and sixth editions of the AMA Guides to the Evaluation of Permanent Impairment (AMA Guides) use left ventricular hypertrophy (LVH) as a variable to determine impairment caused by hypertensive disease. The issue of LVH, as assessed echocardiographically, is a prime example of medical science being at odds with legal jurisprudence. Some legislatures have allowed any cause of LVH in a hypertensive individual to be an allowed manifestation of hypertensive changes. This situation has arisen because a physician can never say that no component of LVH was not caused by the hypertension, even in an individual with a cardiomyopathy or valvular disorder. This article recommends that evaluators consider three points: if the cause of the LVH is hypertension, is the examinee at maximum medical improvement; is the LVH caused by hypertension or another factor; and, if apportionment is allowed, then a careful analysis of the risk factors for other disorders associated with LVH is necessary. The left ventricular mass index should be present in the echocardiogram report and can guide the interpretation of the alleged LVH; if not present, it should be requested because it facilitates a more accurate analysis. Further, if the cause of the LVH is more likely independent of the hypertension, then careful reasoning and an explanation should be included in the impairment report. If hypertension is only a partial cause, a reasoned analysis and clear explanation of the apportionment are required.

Finding decision support requirements for effective intelligence analysis tools

2005 ◽  
Author(s):  
William Elm ◽  
Scott Potter ◽  
James Tittle ◽  
David Woods ◽  
Justin Grossman ◽  
...  
Keyword(s):  
Decision Support ◽  
Intelligence Analysis ◽  
Analysis Tools

Lack of Tenderness: The Main Culprit for the Relationship between Husband and Wife in Lady Chatterley’s Lover

2017 ◽  
Keyword(s):  
Careful Analysis ◽  
Physical Distance ◽  
Human Society ◽  
Human Relationships ◽  
Main Culprit ◽  
Industrial Civilization ◽  
Lady Chatterley's Lover ◽  
The Relationship ◽  
Winter Hibernation ◽  
Husband And Wife

This article presents the case of Chatterley and Clifford, the two main characters in Lady Chatterley’s Lover, to consider tenderness a basic working emotion to shape human relationships. The lack of tenderness causes emotional as well as physical distance in relation, especially that of male-female’s relation. The first part of the article reviews tenderness. The second part reviews how tenderness and lack of tenderness affect a male-female relationship in the selected novel, Lady Chatterley’s Lover. On the basis of a careful analysis of Lady Chatterley’s Lover, the present writer tries to prove that the lack of tenderness is the main culprit for the broken relationship between husband and wife: a major one of the relations between man and woman in human society and mutual tenderness elicits people awakening to a new way of living in an exterior world that is uncracking after the long winter hibernation. Lawrence, through a revelation of Connie’s gradual awakening from tenderness, has made his utmost effort to explore possible solutions to harmonious androgyny between men and women so as to revitalize the distorted human nature caused by the industrial civilization. Key words: relationship, husband and wife, tenderness, main culprit, Connie

Improving Production System Performance Using Overall Equipment Effectiveness

2020 ◽  
Vol 6 (1) ◽  
Author(s):  
Lance Clarence ◽  
Wan Muhammad Noor Sarbani Mat Daud
Keyword(s):  
Production System ◽  
System Performance ◽  
Intelligent System ◽  
Global Market ◽  
Equipment Failure ◽  
Intuitive Knowledge ◽  
Analysis Tools ◽  
New Process ◽  
Knowledge Delivery

In the competition among organization on the global market, no organization will tolerate losses. Overall Equipment Effectiveness (OEE) overall is a new process in which the efficiency of a system is calculated and complicated manufacturing issues are truly simplified to simple and intuitive knowledge delivery. It thinks about the exceptionally important measures of productivity. An endeavour has been done to measure and analyse existing Overall Equipment Effectiveness (OEE) at company Kirino in hope to reduce unplanned downtime losses on equipment failure and tooling damage to maximize the productivity. The methods used to analyse these various causes were analysis tools and Intelligence Systems. After knowing the causes of various activities that leads to high rates of defects, then recommendations for improvements that could be used by company Kirino were ready to be made using intelligent system as a medium of solution

On Statistics of Log-Ratio of Arithmetic Mean to Geometric Mean for Nakagami-m Fading Power

2012 ◽  
Vol E95-B (2) ◽  
pp. 647-650
Author(s):  
Ning WANG ◽  
Julian CHENG ◽  
Chintha TELLAMBURA
Keyword(s):  
Geometric Mean ◽  
Arithmetic Mean ◽  
Log Ratio
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