Preparation and Properties of Thick Film Resistors Containing Cadmium Glasses and Cadmium Oxide
Keyword(s):
X Ray
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The electrical properties of resistors comprising finely divided CdO and cadmium glass, were investigated. The change in a temperature coefficient of resistance from about −500 ppm/℃ to +70 ppm/℃ was realized by addition of a further component to the resistor paste. Differential thermal analysis, X-ray diffraction analysis and scanning electron microscopy were used for studying crystalline phases in glass containing CdO.
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Scanning electron microscopy, X-ray diffraction and thermal analysis study of the TiH2 foaming agent
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Vol 72
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pp. 87-93
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