Optimization of Empirical Modelling of Advanced Highly Strained In0.7Ga0.3As/In0.52Al0.48As pHEMTs for Low Noise Amplifier
2017 ◽
Vol 7
(6)
◽
pp. 3002
Keyword(s):
<span>An optimized empirical modelling for a 0.25µm gate length of highly strained channel of an InP-based pseudomorphic high electron mobility transistor (pHEMT) using InGaAs–InAlAs material systems is presented. An accurate procedure for extraction is described and tested using the pHEMT measured dataset of I-V characteristics and related multi-bias s-parameters over 20GHz frequency range. The extraction of linear and nonlinear parameters from the small signal and large signal pHEMT equivalent model are performed in ADS. The optimized DC and S-parameter model for the pHEMT device provides a basis for active device selection in the MMIC low noise amplifier circuit designs.</span>
2011 ◽
Vol 54
(2)
◽
pp. 329-332
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2010 ◽
Vol 4
(9)
◽
pp. 1208
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2018 ◽
Vol 28
(8)
◽
pp. e21425
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2016 ◽
Vol 11
(04)
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pp. 28-34
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Keyword(s):
Keyword(s):
2009 ◽
Vol 48
(4)
◽
pp. 04C094
◽
2019 ◽
Vol 8
(3)
◽
pp. 152-157
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Keyword(s):