Annealing Behaviors of Al and Al–Mg–Si Alloy: A Real-Time Synchrotron X-ray Scattering Study

We have studied the annealing behaviors of pure Al (Al-1050) and Al–Mg–Si alloy (Al-6061) with plate-type using a real-time synchrotron X-ray scattering in vacuum. At room temperature (RT), the crystal domain size of Al phase in the Al–Mg–Si alloy was small as 70 nm, compared to that in the pure Al, 142 nm. The crystal Al phase in the Al–Mg–Si alloy has more thermal stability than that in the pure Al. The crystal Al phase in the Al–Mg–Si alloy was thermally stable in amount and size up to 250 °C. These are due to the existence of intermetallic crystal Mg2Si phase, which is thermally stable in amount and size up to 250 °C.