Deceleration of probe beam by stage bias potential improves resolution of serial block-face scanning electron microscopic images
2016 ◽
Vol 2
(1)
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Keyword(s):
Keyword(s):
2012 ◽
Vol 2
(3)
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pp. 215-221
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1985 ◽
Vol 137
(1)
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pp. 75-83
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1984 ◽
Vol 64
(2)
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pp. 161-178
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Keyword(s):
1999 ◽
Vol 254
(1)
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pp. 116-126
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2019 ◽
Vol 207
(1)
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pp. 1-11
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2016 ◽
Vol 49
(3)
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pp. 154-162
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