High-precision Fourier forward modeling of potential fields

Geophysics ◽  
2014 ◽  
Vol 79 (5) ◽  
pp. G59-G68 ◽  
Author(s):  
Leyuan Wu ◽  
Gang Tian
Keyword(s):  
High Precision ◽  
Forward Modeling ◽  
Potential Fields

High-precision Downward Continuation of Potential Fields Algorithm Utilizing Adaptive Damping Coefficient of Generalized Minimal Residuals

2021 ◽  
Author(s):  
Zhi-Hou Zhang ◽  
Xiao-Long Liao ◽  
Ze-Yu Shi ◽  
Anthony R. Lowry ◽  
Yao Yu ◽  
...  
Keyword(s):  
High Precision ◽  
Downward Continuation ◽  
Damping Coefficient ◽  
Potential Fields

scholarly journals Peering into the formation history of β Pictoris b with VLTI/GRAVITY long-baseline interferometry

2020 ◽  
Vol 633 ◽  
pp. A110 ◽  
Author(s):  
◽  
M. Nowak ◽  
S. Lacour ◽  
P. Mollière ◽  
J. Wang ◽  
...  
Keyword(s):  
High Precision ◽  
Giant Planet ◽  
Forward Modeling ◽  
High Mass ◽  
Band Spectrum ◽  
Orbital Parameters ◽  
Long Baseline ◽  
Very Large Telescope ◽  
Medium Resolution ◽  
Core Accretion

Context. β Pictoris is arguably one of the most studied stellar systems outside of our own. Some 30 yr of observations have revealed a highly-structured circumstellar disk, with rings, belts, and a giant planet: β Pictoris b. However very little is known about how this system came into being. Aims. Our objective is to estimate the C/O ratio in the atmosphere of β Pictoris b and obtain an estimate of the dynamical mass of the planet, as well as to refine its orbital parameters using high-precision astrometry. Methods. We used the GRAVITY instrument with the four 8.2 m telescopes of the Very Large Telescope Interferometer to obtain K-band spectro-interferometric data on β Pic b. We extracted a medium resolution (R = 500) K-band spectrum of the planet and a high-precision astrometric position. We estimated the planetary C/O ratio using two different approaches (forward modeling and free retrieval) from two different codes (ExoREM and petitRADTRANS, respectively). Finally, we used a simplified model of two formation scenarios (gravitational collapse and core-accretion) to determine which can best explain the measured C/O ratio. Results. Our new astrometry disfavors a circular orbit for β Pic b (e = 0.15−0.04+0.05). Combined with previous results and with HIPPARCOS/Gaia measurements, this astrometry points to a planet mass of M = 12.7 ± 2.2 MJup. This value is compatible with the mass derived with the free-retrieval code petitRADTRANS using spectral data only. The forward modeling and free-retrieval approches yield very similar results regarding the atmosphere of β Pic b. In particular, the C/O ratios derived with the two codes are identical (0.43 ± 0.05 vs. 0.43−0.03+0.04). We argue that if the stellar C/O in β Pic is Solar, then this combination of a very high mass and a low C/O ratio for the planet suggests a formation through core-accretion, with strong planetesimal enrichment.

Automatic measurement of SAED patterns from asbestos minerals

1988 ◽  
Vol 46 ◽  
pp. 846-847
Author(s):  
J. C. Russ ◽  
T. Taguchi ◽  
P. M. Peters ◽  
E. Chatfield ◽  
J. C. Russ ◽  
...  
Keyword(s):  
Diffraction Pattern ◽  
High Precision ◽  
Diffraction Data ◽  
Automatic Measurement ◽  
Automatic Method ◽  
Important Method ◽  
X Ray ◽  
Integrated Intensity ◽  
Asbestiform Minerals ◽  
True Center

Conventional SAD patterns as obtained in the TEM present difficulties for identification of materials such as asbestiform minerals, although diffraction data is considered to be an important method for making this purpose. The preferred orientation of the fibers and the spotty patterns that are obtained do not readily lend themselves to measurement of the integrated intensity values for each d-spacing, and even the d-spacings may be hard to determine precisely because the true center location for the broken rings requires estimation. We have implemented an automatic method for diffraction pattern measurement to overcome these problems. It automatically locates the center of patterns with high precision, measures the radius of each ring of spots in the pattern, and integrates the density of spots in that ring. The resulting spectrum of intensity vs. radius is then used just as a conventional X-ray diffractometer scan would be, to locate peaks and produce a list of d,I values suitable for search/match comparison to known or expected phases.

On effects of non-systematic reflections on weak-beam images of partial dislocations

1991 ◽  
Vol 49 ◽  
pp. 688-689
Author(s):  
K. Z. Botros ◽  
S. S. Sheinin
Keyword(s):  
High Precision ◽  
Stacking Fault ◽  
Important Application ◽  
Stacking Fault Energy ◽  
Sharp Peak ◽  
Weak Beam ◽  
Partial Dislocations ◽  
Deviation Parameter ◽  
Beam Diffraction

The main features of weak beam images of dislocations were first described by Cockayne et al. using calculations of intensity profiles based on the kinematical and two beam dynamical theories. The feature of weak beam images which is of particular interest in this investigation is that intensity profiles exhibit a sharp peak located at a position very close to the position of the dislocation in the crystal. This property of weak beam images of dislocations has an important application in the determination of stacking fault energy of crystals. This can easily be done since the separation of the partial dislocations bounding a stacking fault ribbon can be measured with high precision, assuming of course that the weak beam relationship between the positions of the image and the dislocation is valid. In order to carry out measurements such as these in practice the specimen must be tilted to "good" weak beam diffraction conditions, which implies utilizing high values of the deviation parameter Sg.

Digital differential hysteresis iimage processing displays what the microscope acquires but the eye can't see

1995 ◽  
Vol 53 ◽  
pp. 642-643
Author(s):  
Klaus-Ruediger Peters
Keyword(s):  
Image Processing ◽  
Visual System ◽  
High Precision ◽  
Image Data ◽  
Processing Technology ◽  
Output Data ◽  
Contrast Resolution ◽  
Pixel Intensity ◽  
Data Reading ◽  
Hysteresis Properties

Differential hysteresis processing is a new image processing technology that provides a tool for the display of image data information at any level of differential contrast resolution. This includes the maximum contrast resolution of the acquisition system which may be 1,000-times higher than that of the visual system (16 bit versus 6 bit). All microscopes acquire high precision contrasts at a level of <0.01-25% of the acquisition range in 16-bit - 8-bit data, but these contrasts are mostly invisible or only partially visible even in conventionally enhanced images. The processing principle of the differential hysteresis tool is based on hysteresis properties of intensity variations within an image.Differential hysteresis image processing moves a cursor of selected intensity range (hysteresis range) along lines through the image data reading each successive pixel intensity. The midpoint of the cursor provides the output data. If the intensity value of the following pixel falls outside of the actual cursor endpoint values, then the cursor follows the data either with its top or with its bottom, but if the pixels' intensity value falls within the cursor range, then the cursor maintains its intensity value.

High resolution and high precision beta-spectrometry

Physica ◽  
1952 ◽  
Vol 18 (2) ◽  
pp. 1063-1065 ◽  
Author(s):  
R SIDAY
Keyword(s):  
High Resolution ◽  
High Precision ◽  
Beta Spectrometry
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