Manufacturing Test

2020 ◽

Author(s):

Atif Siddiqui ◽

Pablo Otero ◽

Muhammad Yousuf Irfan Zia ◽

Javier Poncela

Keyword(s):

Electronic Products ◽

Manufacturing Test

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IC manufacturing test cost estimation at early stages of the design cycle

Microelectronics Journal ◽

10.1016/s0026-2692(98)00159-1 ◽

1999 ◽

Vol 30 (8) ◽

pp. 733-738 ◽

Cited By ~ 1

Author(s):

Tom Chen ◽

Kim Von-Kyoung ◽

Mick Tegethoff

Keyword(s):

Cost Estimation ◽

Test Cost ◽

Early Stages ◽

Ic Manufacturing ◽

Design Cycle ◽

Manufacturing Test

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Investigation into voltage and process variation-aware manufacturing test

2011 IEEE International Test Conference ◽

10.1109/test.2011.6139138 ◽

2011 ◽

Cited By ~ 2

Author(s):

Urban Ingelsson ◽

Bashir M. Al-Hashimi

Keyword(s):

Process Variation ◽

Manufacturing Test

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Embedded deterministic test for low cost manufacturing test

Proceedings. International Test Conference ◽

10.1109/test.2002.1041773 ◽

2003 ◽

Cited By ~ 265

Author(s):

J. Rajski ◽

J. Tyszer ◽

M. Kassab ◽

N. Mukherjee ◽

R. Thompson ◽

...

Keyword(s):

Low Cost ◽

Manufacturing Test ◽

Low Cost Manufacturing

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Dynamic statistical control of manufacturing test

IEEE Design & Test of Computers ◽

10.1109/54.57913 ◽

1990 ◽

Vol 7 (4) ◽

pp. 39-51 ◽

Cited By ~ 2

Author(s):

S.P. Ghosh ◽

E.G. Grochowski

Keyword(s):

Statistical Control ◽

Manufacturing Test

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IEEE P1505.3™ Standard BAE manufacturing test interface implementation

2016 IEEE AUTOTESTCON ◽

10.1109/autest.2016.7589622 ◽

2016 ◽

Author(s):

Michael Stora ◽

Rob Spinner ◽

Steve Mann ◽

George Isabella ◽

David Droste ◽

...

Keyword(s):

Manufacturing Test

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9C: Panel Session - Are DFT and Manufacturing Test Good Boosts for DFM? [Breaker page]

23rd IEEE VLSI Test Symposium (VTS'05) ◽

10.1109/vts.2005.22 ◽

2005 ◽

Keyword(s):

Panel Session ◽

Manufacturing Test

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Selecting High-Quality Delay Tests for Manufacturing Test and Debug

2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems ◽

10.1109/dft.2006.57 ◽

2006 ◽

Cited By ~ 12

Author(s):

Hangkyu Lee ◽

Suriyaprakash Natarajan ◽

Srinivas Patil ◽

Irith Pomeranz

Keyword(s):

High Quality ◽

Manufacturing Test ◽

Delay Tests

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Routing algorithms for programmable logic device design and manufacturing test development

2001 IEEE Autotestcon Proceedings. IEEE Systems Readiness Technology Conference. (Cat. No.01CH37237) ◽

10.1109/autest.2001.948966 ◽

2002 ◽

Author(s):

J.R. Heath ◽

N.J. Vocke ◽

C.E. Stroud ◽

J. Emmert

Keyword(s):

Test Development ◽

Routing Algorithms ◽

Programmable Logic ◽

Device Design ◽

Logic Device ◽

Programmable Logic Device ◽

Design And Manufacturing ◽

Manufacturing Test

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DFT for high-quality low cost manufacturing test

Proceedings 10th Asian Test Symposium ◽

10.1109/ats.2001.990250 ◽

2002 ◽

Cited By ~ 15

Author(s):

J. Rajski

Keyword(s):

Low Cost ◽

High Quality ◽

Manufacturing Test ◽

Low Cost Manufacturing

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An Approach for Collection and Analysis of Manufacturing Test Sites Data for Electronic Products

IC manufacturing test cost estimation at early stages of the design cycle

Investigation into voltage and process variation-aware manufacturing test

Embedded deterministic test for low cost manufacturing test

Dynamic statistical control of manufacturing test

IEEE P1505.3™ Standard BAE manufacturing test interface implementation

9C: Panel Session - Are DFT and Manufacturing Test Good Boosts for DFM? [Breaker page]

Selecting High-Quality Delay Tests for Manufacturing Test and Debug

Routing algorithms for programmable logic device design and manufacturing test development

DFT for high-quality low cost manufacturing test

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