Emission of C+20 by Field Evaporation from CNT

Author(s):  
Yahachi Saito
Keyword(s):  
Author(s):  
H.C. Eaton ◽  
B.N. Ranganathan ◽  
T.W. Burwinkle ◽  
R. J. Bayuzick ◽  
J.J. Hren

The shape of the emitter is of cardinal importance to field-ion microscopy. First, the field evaporation process itself is closely related to the initial tip shape. Secondly, the imaging stress, which is near the theoretical strength of the material and intrinsic to the imaging process, cannot be characterized without knowledge of the emitter shape. Finally, the problem of obtaining quantitative geometric information from the micrograph cannot be solved without knowing the shape. Previously published grain-boundary topographies were obtained employing an assumption of a spherical shape (1). The present investigation shows that the true shape deviates as much as 100 Å from sphericity and boundary reconstructions contain considerable error as a result.Our present procedures for obtaining tip shape may be summarized as follows. An empirical projection, D=f(θ), is obtained by digitizing the positions of poles on a field-ion micrograph.


Author(s):  
Patrick P. Camus

The theory of field ion emission is the study of electron tunneling probability enhanced by the application of a high electric field. At subnanometer distances and kilovolt potentials, the probability of tunneling of electrons increases markedly. Field ionization of gas atoms produce atomic resolution images of the surface of the specimen, while field evaporation of surface atoms sections the specimen. Details of emission theory may be found in monographs.Field ionization (FI) is the phenomena whereby an electric field assists in the ionization of gas atoms via tunneling. The tunneling probability is a maximum at a critical distance above the surface,xc, Fig. 1. Energy is required to ionize the gas atom at xc, I, but at a value reduced by the appliedelectric field, xcFe, while energy is recovered by placing the electron in the specimen, φ. The highest ionization probability occurs for those regions on the specimen that have the highest local electric field. Those atoms which protrude from the average surfacehave the smallest radius of curvature, the highest field and therefore produce the highest ionizationprobability and brightest spots on the imaging screen, Fig. 2. This technique is called field ion microscopy (FIM).


1984 ◽  
Vol 45 (C9) ◽  
pp. C9-179-C9-182
Author(s):  
G. L.R. Mair ◽  
T. Mulvey ◽  
R. G. Forbes

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-141-C8-146
Author(s):  
A. GAUSSMANN ◽  
W. DRACHSEL ◽  
J. H. BLOCK

1989 ◽  
Vol 50 (C8) ◽  
pp. C8-135-C8-140
Author(s):  
C. MAINKA ◽  
W. DRACHSEL ◽  
J. H. BLOCK ◽  
G. KOZLOWSKI

2021 ◽  
Vol 27 (S1) ◽  
pp. 404-406
Author(s):  
Charles Fletcher ◽  
Michael Moody ◽  
Jeroen Scheerder ◽  
Claudia Fleischmann ◽  
Brian Geiser ◽  
...  

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