scholarly journals Instrument-Dependent Factors Affecting the Precision in the Atomic Force Microscopy Stiffness Measurement of Nanoscale Liposomes

2020 ◽  
Vol 68 (5) ◽  
pp. 473-478
Author(s):  
Yuki Takechi-Haraya ◽  
Yukihiro Goda ◽  
Kenichi Izutsu ◽  
Kumiko Sakai-Kato
Keyword(s):  
Atomic Force Microscopy ◽  
Factors Affecting ◽  
Force Microscopy ◽  
Stiffness Measurement ◽  
Atomic Force

High-Speed Atomic Force Microscopy Reveals Factors Affecting the Processivity of Chitinases during Interfacial Enzymatic Hydrolysis of Crystalline Chitin

ACS Catalysis ◽  
2020 ◽  
Vol 10 (22) ◽  
pp. 13606-13615
Author(s):  
Mingbo Qu ◽  
Takahiro Watanabe-Nakayama ◽  
Shaopeng Sun ◽  
Kenichi Umeda ◽  
Xiaoxi Guo ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Enzymatic Hydrolysis ◽  
High Speed ◽  
Factors Affecting ◽  
Force Microscopy ◽  
Atomic Force ◽  
Hydrolysis Of

scholarly journals Performance test of cantilever transfer standard used for afm tip calibration based on electromagnetic compensation

ACTA IMEKO ◽  
2020 ◽  
Vol 9 (5) ◽  
pp. 129
Author(s):  
J. Jiang ◽  
H. Zhou ◽  
Y. Zhang ◽  
S. Wu ◽  
Z. Zhang ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Performance Test ◽  
Test Apparatus ◽  
Relative Uncertainty ◽  
Transfer Standard ◽  
Force Microscopy ◽  
Stiffness Measurement ◽  
Calibration Test ◽  
Atomic Force

This paper describes stiffness measurement of cantilever transfer standards used for Atomic Force Microscopy (AFM) tip calibration based on electromagnetic compensation. The transfer standard of cantilever is designed and manufactured based on the bulk fabrication of SOI wafers. The measure range of the transfer standard covers from 0.04 N/m to 16 N/m. The series of transfer standard is designed for the calibration test of the cantilever used in AFM, along with the test apparatus specifically designed. The relative uncertainty of the stiffness is smaller than 2.4 % (<em>k</em> = 2).

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