scholarly journals Characterization of GaN and InN Nucleation Layers by Reflection High Energy Electron Diffraction

2016 ◽  
Vol 29 (3) ◽  
pp. 124-131
Author(s):  
Hyunseok Na
2013 ◽  
Vol 6 (6) ◽  
pp. 063003 ◽  
Author(s):  
Hiroyuki Hosoya ◽  
Yoshinori Nagamine ◽  
Koji Tsunekawa ◽  
Vadym Zayets ◽  
Shinji Yuasa

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