Characterization of surface structure. Reflection high energy electron diffraction-Auger electron spectroscopy (RHEED-AES method).
1999 ◽
Vol 17
(4)
◽
pp. 1525
◽
1972 ◽
Vol 119
(6)
◽
pp. 772
◽
1993 ◽
Vol 11
(5)
◽
pp. 2676-2680
◽
2006 ◽
Vol 45
(9A)
◽
pp. 7063-7079
◽
1996 ◽
Vol 35
(Part 2, No. 12B)
◽
pp. L1695-L1698
◽