Characterization of molecular-beam epitaxially grown CdTe surfaces by high-energy electron diffraction and synchrotron radiation photo-emission spectroscopy
1988 ◽
Vol 6
(3)
◽
pp. 1343-1347
◽
1994 ◽
Vol 137
(1-2)
◽
pp. 187-194
◽
1992 ◽
Vol 10
(4)
◽
pp. 1784
◽
Keyword(s):
Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
◽
Keyword(s):
1996 ◽
Vol 35
(Part 2, No. 3B)
◽
pp. L366-L369
◽