Characterization of Ultrathin Fe–Co Layer Grown on Amorphous Co–Fe–B by In situ Reflective High-Energy Electron Diffraction
1994 ◽
Vol 137
(1-2)
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pp. 187-194
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Keyword(s):
Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth
2011 ◽
pp. 3-28
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Keyword(s):
Keyword(s):
Keyword(s):
1998 ◽
Vol 16
(3)
◽
pp. 1507
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Keyword(s):
2011 ◽
pp. 180-211
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Keyword(s):
Keyword(s):