The characterization of the growth of sub-monolayer coverages of Si and Be on GaAs(001)-c(4×4) & (2×4)-β by reflectance anisotropy spectroscopy and reflection high-energy electron diffraction

Low Dimensional Structures Prepared by Epitaxial Growth or Regrowth on Patterned Substrates ◽

10.1007/978-94-011-0341-1_11 ◽

1995 ◽

pp. 113-123

Author(s):

D. A. Woolf ◽

K. C. Rose ◽

S. J. Morris ◽

D. I. Westwood ◽

J. Rumberg ◽

...

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

Reflectance Anisotropy

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The characterization of the growth of sub-monolayer coverages ( to 1 monolayer) of Si and Be on GaAs(001): A reflectance anisotropy spectroscopy and reflection high-energy electron diffraction study

Journal of Crystal Growth ◽

10.1016/0022-0248(95)80206-r ◽

1995 ◽

Vol 150 ◽

pp. 197-201 ◽

Author(s):

D.A. Woolf ◽

K.C. Rose ◽

S.J. Morris ◽

D.I. Westwood ◽

J. Rumberg ◽

...

Keyword(s):

Electron Diffraction ◽

Diffraction Study ◽

Electron Diffraction Study ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

Reflectance Anisotropy

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In-situ characterization of II/VI molecular beam epitaxy growth using reflection high-energy electron diffraction oscillations

Journal of Crystal Growth ◽

10.1016/0022-0248(94)91270-x ◽

1994 ◽

Vol 137 (1-2) ◽

pp. 187-194 ◽

Author(s):

J.M. Gaines

Keyword(s):

Molecular Beam Epitaxy ◽

Electron Diffraction ◽

Molecular Beam ◽

High Energy ◽

Energy Electron ◽

Molecular Beam Epitaxy Growth ◽

High Energy Electron ◽

In Situ Characterization

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In situ growth regime characterization of cubic GaN using reflection high energy electron diffraction

Applied Physics Letters ◽

10.1063/1.2432293 ◽

2007 ◽

Vol 90 (4) ◽

pp. 041918 ◽

Author(s):

J. Schörmann ◽

S. Potthast ◽

D. J. As ◽

K. Lischka

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Energy Electron ◽

In Situ Growth ◽

High Energy Electron ◽

Growth Regime ◽

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Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth

In Situ Characterization of Thin Film Growth ◽

10.1533/9780857094957.1.3 ◽

2011 ◽

pp. 3-28 ◽

Author(s):

G. Koster

Keyword(s):

Thin Film ◽

Electron Diffraction ◽

Film Growth ◽

High Energy ◽

Thin Film Growth ◽

Energy Electron ◽

High Energy Electron ◽

In Situ Characterization

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Characterization of growth and crystallization processes in CoFeB∕MgO∕CoFeB magnetic tunnel junction structure by reflective high-energy electron diffraction

Applied Physics Letters ◽

10.1063/1.2140612 ◽

2005 ◽

Vol 87 (24) ◽

pp. 242503 ◽

Author(s):

Shinji Yuasa ◽

Yoshishige Suzuki ◽

Toshikazu Katayama ◽

Koji Ando

Keyword(s):

Electron Diffraction ◽

Tunnel Junction ◽

Magnetic Tunnel Junction ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

Junction Structure

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Reflection High-Energy Electron Diffraction Characterization of Cobalt Clusters Electrodeposited on a Au(100) Electrode

The Journal of Physical Chemistry C ◽

10.1021/jp1065924 ◽

2010 ◽

Vol 114 (47) ◽

pp. 20062-20067 ◽

Author(s):

Hengliang Wu ◽

Mauscheng Zei ◽

Shuehlin Yau

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

Cobalt Clusters

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Reflectance anisotropy and reflection high-energy electron diffraction intensity oscillations during gas source molecular beam epitaxy growth of Si and SiGe on Si(001)

Journal of Crystal Growth ◽

10.1016/0022-0248(95)80093-r ◽

1995 ◽

Vol 150 ◽

pp. 1015-1019 ◽

Author(s):

J. Zhang ◽

A.G. Taylor ◽

J.M. Fernández ◽

B.A. Joyce ◽

A.R. Turner ◽

...

Keyword(s):

Molecular Beam Epitaxy ◽

Electron Diffraction ◽

Molecular Beam ◽

High Energy ◽

Energy Electron ◽

Molecular Beam Epitaxy Growth ◽

High Energy Electron ◽

Diffraction Intensity ◽

Reflectance Anisotropy ◽

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Sub-monolayer coverages of Be grown on GaAs(001)-c(4 × 4) and (2 × 4)-β by molecular beam epitaxy studied by reflectance anisotropy spectroscopy and reflection high-energy electron diffraction

Applied Surface Science ◽

10.1016/0169-4332(96)00467-9 ◽

1996 ◽

Vol 103 (1) ◽

pp. 71-78

Author(s):

K.C. Rose ◽

D.A. Woolf ◽

S.J. Morris ◽

D.I. Westwood ◽

R.H. Williams ◽

...

Keyword(s):

Molecular Beam Epitaxy ◽

Electron Diffraction ◽

Molecular Beam ◽

High Energy ◽

Energy Electron ◽

High Energy Electron ◽

Reflectance Anisotropy

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Characterization of molecular-beam epitaxially grown CdTe surfaces by high-energy electron diffraction and synchrotron radiation photo-emission spectroscopy

Vacuum ◽

10.1016/0042-207x(89)90888-9 ◽

1989 ◽

Vol 39 (10) ◽

pp. 989

Keyword(s):

Synchrotron Radiation ◽

Electron Diffraction ◽

Emission Spectroscopy ◽

Molecular Beam ◽

High Energy ◽

Energy Electron ◽

High Energy Electron

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Characterization of Ultrathin Fe–Co Layer Grown on Amorphous Co–Fe–B by In situ Reflective High-Energy Electron Diffraction

Applied Physics Express ◽

10.7567/apex.6.063003 ◽

2013 ◽

Vol 6 (6) ◽

pp. 063003 ◽

Author(s):

Hiroyuki Hosoya ◽

Yoshinori Nagamine ◽

Koji Tsunekawa ◽

Vadym Zayets ◽

Shinji Yuasa

Keyword(s):

Electron Diffraction ◽

High Energy ◽

Energy Electron ◽

High Energy Electron

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