scholarly journals Embedded Radiation sensor with OBIST structure for applications in mixed signal systems

Author(s):  
Pablo Petrashin ◽  
Walter Lancioni ◽  
Agustín Laprovitta ◽  
Juan Castagnola

Oscillation based testing (OBT) has proven to be a simple and effective test strategy for numerous kind of circuits. In this work, OBT is applied to a radiation sensor to be used as a VLSI cell in embedded applications, implementing an oscillation built-in self-test (OBIST) structure. The oscillation condition is achieved by means of a minimally intrusive switched feedback loop and the response evaluation circuit can be included in a very simple way, minimizing the hardware overhead. The fault simulation indicates a fault coverage of 100% for the circuit under test.Keywords: fault simulation, mixed signal testing, OBIST, oscillation-based test, VLSI testing.

1996 ◽  
Vol 8 (2) ◽  
pp. 143-152 ◽  
Author(s):  
Pascal Caunegre ◽  
Claude Abraham

2013 ◽  
Vol 61 (3) ◽  
pp. 691-696 ◽  
Author(s):  
R. Suszynski ◽  
K. Wawryn

Abstract A rapid prototyping method for designing mixed signal systems has been presented in the paper. The method is based on implementation of the field programmable analog array (FPAA) to configure and reconfigure mixed signal systems. A serial algorithmic analog digital converter has been used as an example. Three converter architectures have been selected and implemented FPAA device. To verify and illustrate converters operation and prototyping capabilities, implemented converters have been excited by a sinusoidal signal. Analog sinusoidal excitations, digital responses and sinusoidal waveforms after reconstruction are presented.


2012 ◽  
Vol 1 (1) ◽  
pp. 1-7
Author(s):  
Vadim Geurkov ◽  
◽  
Lev Kirischian ◽  
Keyword(s):  

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