OS04F033 Microstructural Characterization of Nanocrystalline Nickel Thin Films by X-Ray Diffraction

Author(s):  
Keiseke Tanaka ◽  
Masashi Sakakibara ◽  
Hiroto Tanaka ◽  
Hirohisa Kiamchi
2004 ◽  
Vol 108 (17) ◽  
pp. 5189-5191
Author(s):  
Ivano Alessandri ◽  
Marcello Gelfi ◽  
Elza Bontempi ◽  
Roberto Roberti ◽  
Laura E. Depero

2015 ◽  
Vol 64 (7) ◽  
pp. 528-535 ◽  
Author(s):  
Keisuke TANAKA ◽  
Yuuki KOIKE ◽  
Katsuki SANO ◽  
Hiroto TANAKA ◽  
Shutaro MACHIYA ◽  
...  

1989 ◽  
Vol 25 (2) ◽  
pp. 2245-2249 ◽  
Author(s):  
J. Sizemore ◽  
R. Barton ◽  
A. Marshall ◽  
J.C. Bravman ◽  
M. Naito ◽  
...  

2014 ◽  
Vol 805 ◽  
pp. 343-349
Author(s):  
Carine F. Machado ◽  
Weber G. Moravia

This work evaluated the influence of additions of the ceramic shell residue (CSR), from the industries of Lost Wax Casting, in the modulus of elasticity and porosity of concrete. The CSR was ground and underwent a physical, chemical, and microstructural characterization. It was also analyzed, the environmental risk of the residue. In the physical characterization of the residue were analyzed, the surface area, and particle size distribution. In chemical characterization, the material powder was subjected to testing of X-ray fluorescence (XRF). Microstructural characterization was performed by scanning electron microscopy (SEM) and X-ray diffraction (XRD). The residue was utilized like addition by substitution of cement in concrete in the percentages of 10% and 15% by weight of Portland cement. It was evaluated properties of concrete in the fresh and hardened state, such as compressive strength, modulus of elasticity, absorption of water by total immersion and by capillarity. The results showed that the residue can be used in cement matrix and improve some properties of concrete. Thus, the CSR may contribute to improved sustainability and benefit the construction industry.


2013 ◽  
Vol 665 ◽  
pp. 254-262 ◽  
Author(s):  
J.R. Rathod ◽  
Haresh S. Patel ◽  
K.D. Patel ◽  
V.M. Pathak

Group II-VI compounds have been investigated largely in last two decades due to their interesting optoelectronic properties. ZnTe, a member of this family, possesses a bandgap around 2.26eV. This material is now a day investigated in thin film form due to its potential towards various viable applications. In this paper, the authors report their investigations on the preparation of ZnTe thin films using vacuum evaporation technique and their structural and optical characterizations. The structural characterization, carried out using an X-ray diffraction (XRD) technique shows that ZnTe used in present case possesses a cubic structure. Using the same data, the micro strain and dislocation density were evaluated and found to be around 1.465×10-3lines-m2and 1.639×1015lines/m2respecctively. The optical characterization carried out in UV-VIS-NIR region reveals the fact that band gap of ZnTe is around 2.2eV in present case. In addition to this, it was observed that the value of bandgap decreases as the thickness of films increases. The direct transitions of the carries are involved in ZnTe. Using the data of UV-VIS-NIR spectroscopy, the transmission coefficient and extinction coefficient were also calculated for ZnTe thin films. Besides, the variation of extinction coefficient with wavelength has also been discussed here.


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