Effect of Reflow Process for Solder Joint Reliability of Electronic Packages

2002 ◽  
Vol 2002.6 (0) ◽  
pp. 273-274
Author(s):  
Hidehisa SAKAI ◽  
Qiang YU ◽  
Masaki SHIRATORI ◽  
Msanori MOTEGI
Author(s):  
Kanji Takagi ◽  
Qiang Yu ◽  
Tadahiro Shibutani ◽  
Hiroki Miyauchi

The miniaturization and high reliability for automotive electronic components has been strongly requested. Generally, electronic component and printed wiring board are connected using solder joint. The reliability of solder joint has widely dispersion. For the dispersion reduction of solder joint reliability, not only design factors but manufacturing factors should be optimized. The evaluation of manufacturing factors for solder joint reliability was very difficult by experimental evaluation alone. Therefore, the reflow process simulation was established. The simulation was reenacted soldering process on chip component, which was the most severe reliability in automotive electronic components. The novelty of simulation was the coupled analysis of flow and rigid for simulating self-alignment of chip component. In this simulation, contact angle and surface tension was very important factor. So, these characteristics were measured based on Spread test and Wetting balance tests using the specimens. In the result, the solder joint shape of analysis was agree with the one of specimens using the measured contact angle and surface tension. Next, the effect of manufacturing process dispersion for solder joint shape was evaluated. The factors were mount offset and length unbalance of electrodes on chip component. As a result, the mount offset was not affected solder joint shape of chip component until a certain level. Also, the unbalance of electrode of chip component was not almost affected for solder joint shape of chip component because a part was moved to the center of part by surface tension of solder joint. Finally, the relation between the estimated solder joint shape and fatigue life of solder joints is evaluated using crack propagation analysis based on Manson-Coffin’s law and Miner’s rule. When the value of mount offset was large, the crack propagation mode was changed and the fatigue life of solder joint was decreased. As mentioned above, it was able to evaluate the relation between manufacturing factors and solder joint reliability. Accordingly, this simulation was very useful for consideration on the miniaturization, high reliability and appropriate margin for design of electronic components.


2004 ◽  
Vol 2004.10 (0) ◽  
pp. 485-486
Author(s):  
Yoshiteru OCHI ◽  
Masanori MOTEGI ◽  
Hidehisa SAKAI ◽  
Youko TORIYABE

2004 ◽  
Vol 126 (1) ◽  
pp. 52-56 ◽  
Author(s):  
L. L. Meekisho ◽  
K. Nelson-Owusu

The final shape of a solidified solder fillet joint from a reflow process is determined by process parameters and the solder alloy’s physical properties, including surface tension, density, gravity, and wetting angles. This work investigates the influence of surface tension at the solder-atmosphere interface; gravitational effects on the solder, and the influence of wetting angles on the mechanical response of the solder joint when subjected to thermomechanical loads. The predicted optimum fillet shape with minimum fillet area corresponded to the case where the ratio of gravity-to-surface tension forces is almost zero, and wetting angles, θ1 and θ2 being 90 deg. Results from this study suggest that, the influence of gravity on the molten solder geometry is negligible and hence can be assumed to be inconsequential to solder joint reliability issues.


Author(s):  
Kayleen L. E. Helms ◽  
Ketan R. Shah ◽  
Dan Gerbus ◽  
Vasu S. Vasudevan ◽  
Jagadeesh Radhakrishnan ◽  
...  

Increasing power and I/O demands in HDI (high density interconnect) components coupled with the industry-wide conversion to lead-free products has introduced additional risk for solder joint reliability (SJR) of BGA (ball grid array) Flip-Chip electronic packages. One particular concern is SJR under mechanical shock (dynamic bend) loading. While leaded alloys provided good performance in shock for many years due to the unparalleled ability of lead’s slip systems to absorb the energy in shock events, lead-free alloys cannot provide the same benefit. To mitigate this risk, better approaches for understanding damage propagation are needed to enable better design to limit and reduce the SJR risk during shipping and end-user handling. To this end, a characterization study is undertaken to monitor damage progression at the second-level interconnect in BGA’s on flip-chip electronic packages during mechanical shock loading. The study uses a board-level, strain-monitoring approach plus the dye and peel failure analysis technique to track the initiation and propagation of solder joint cracks under loading. The approach being used differs from conventional reliability testing in that both design and load variables are used to quantify damage growth and strain response to bridge the understanding of design feature impact to traditional reliability testing. The scope of the study includes investigating the impact of such factors as package placement, board layout, and enabling load on the monitored board strain and the damage propagation observed. From this study, directions and design guidelines for improving solder joint reliability of future BGA’s on flip-chip electronic packages under mechanical shock loading conditions are proposed.


2014 ◽  
Vol 54 (5) ◽  
pp. 939-944 ◽  
Author(s):  
Ye Tian ◽  
Xi Liu ◽  
Justin Chow ◽  
Yi Ping Wu ◽  
Suresh K. Sitaraman

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