KTN thin films prepared by pulsed laser deposi-tion on transparent single crystal quartz (100)

2005 ◽  
Vol 48 (1) ◽  
pp. 33 ◽  
Author(s):  
Xiaodong WANG
2021 ◽  
Vol 11 (15) ◽  
pp. 6733
Author(s):  
Mira Naftaly ◽  
Andrew Gregory

Z-cut single-crystal quartz and vitreous silica (silica glass or fused silica) were evaluated for use as reference materials for terahertz and microwave measurements of complex permittivity, with Z-cut quartz confirmed as being suitable. Measurements of refractive indices and absorption coefficients for o-ray and e-ray in quartz and for vitreous silica are reported at frequencies between 0.2 and 6 THz and at 36 and 144 GHz, and compared with data reported in the literature. A previously unreported broad band was seen in the extraordinary absorption of quartz. The Boson peak in silica glass absorption was examined, and for the first time, two negative relationships have been observed: between the refractive index and the Boson peak frequency, and between the Boson peak height and its frequency.


2020 ◽  
Vol 995 ◽  
pp. 89-93
Author(s):  
A.N. Jannah ◽  
S.A. Halim ◽  
H. Abdullah

In this study, pulsed laser deposition technique was used to deposit bismuth plumbum strontium calcium copper oxide {Bi (Pb)SrCaCu0} thin films on MgO single crystal substrate. Solid state procedure which is inexpensive technique used in the production process of the Bi (Pb)SrCaCu0 superconductor bulk sample. In this work, Handy YAG Lasers (model: HYL 101 E) has been used. It is a high power class 4 solid state (ND: YAG) Q-switched pulsed laser and 532 nm (visible green: second harmonic) has been used to ablate the films. The substrate used in this work was single crystal MgO with the (100) orientation. Scanning Electron Microscopy (SEM) was used to observe the microstructure of fracture surface and cross section of thin film materials. Variable Pressure Scanning Electron Microscope (LEO-VPSEM) was used to study the correlation between the microstructure features. SEM studies have shown that the surface morphology of the bulk sample comprises platelets of average size ≈10μm with uniform and homogenous microstructure. The typical morphology of the as deposited films showed a continuous phase, granular structure, which spherical particles up to 5μm in diameter. The most prominent types of particulates BPSCCO films on MgO substrate are droplets with smooth surface, bigger droplets with granular surface, spherically-shaped features confined by randomly oriented facets, submicron rod-like features, Cu-enriched needles, platelets, irregularly-shaped Cu-rich outgrowths, strongly Cu-enriched tabular outgrowths, big target fragments, island growth structure, cubic and rectangular cubic structures. SEM analysis also showed that the deposition time have a pronounced influence on the particle size. The target morphology, which develops under laser-irradiation, depends on the laser fluence and the technique, by which the laser beam is moved relatively to the target during ablation. Laser-irradiated surfaces normally become altered both physically and chemically and morphological changes take the form of periodic structures such as ripples and ridges.


2003 ◽  
Vol 796 ◽  
Author(s):  
Fumiaki Mitsugi ◽  
Seiji Kanazawa ◽  
Toshikazu Ohkubo ◽  
Yukiharu Nomoto ◽  
Yusaku Takita ◽  
...  

ABSTRACTAn La1-xSrxGa1-y-zMgyCozO3-(x+y+z)/2 (LSGMCO) has attracted much attention because it can be useable as an electrolyte of a solid oxide fuel cell due to its high oxide ion conductivity. We prepared LSGMCO thin films on silica glass and LaAlO3 single crystal substrates by pulsed laser deposition and evaluated their properties. LSGMCO thin films deposited at 800°C were poly-crystal and the deposition pressure affected their surface morphologies. In the case of the LaAlO3 single crystal substrate, a c-axis oriented LSGMCO thin film was obtained. DC conductivity and complex impedance of LSGMCO thin films were measured in vacuum atmosphere to investigate the effect of the crystal orientation on the oxide ion conductivity. It was revealed that resistance at a grain boundary of films is more dominant compare with the grain interior.


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