Tailoring Thermal Emission with Epsilon-Near-Zero Media Augmented with Dielectric Rods

Author(s):  
Iñigo Liberal ◽  
Nader Engheta
Author(s):  
Irfan Khan ◽  
Owen Dominguez ◽  
Junchi Lu ◽  
Leland Nordin ◽  
Daniel Wasserman ◽  
...  

2016 ◽  
Vol 7 (1) ◽  
Author(s):  
P. N. Dyachenko ◽  
S. Molesky ◽  
A. Yu Petrov ◽  
M. Störmer ◽  
T. Krekeler ◽  
...  

2014 ◽  
Vol 105 (13) ◽  
pp. 131109 ◽  
Author(s):  
Young Chul Jun ◽  
Ting S. Luk ◽  
A. Robert Ellis ◽  
John F. Klem ◽  
Igal Brener

2018 ◽  
Vol 115 (12) ◽  
pp. 2878-2883 ◽  
Author(s):  
Iñigo Liberal ◽  
Nader Engheta

The control and manipulation of thermal fields is a key scientific and technological challenge, usually addressed with nanophotonic structures with a carefully designed geometry. Here, we theoretically investigate a different strategy based on epsilon-near-zero (ENZ) media. We demonstrate that thermal emission from ENZ bodies is characterized by the excitation of spatially static fluctuating fields, which can be resonantly enhanced with the addition of dielectric particles. The “spatially static” character of these temporally dynamic fields leads to enhanced spatial coherence on the surface of the body, resulting in directive thermal emission. By contrast with other approaches, this property is intrinsic to ENZ media and it is not tied to its geometry. This point is illustrated with effects such as geometry-invariant resonant emission, beamforming by boundary deformation, and independence with respect to the position of internal particles. We numerically investigate a practical implementation based on a silicon carbide body containing a germanium rod.


Author(s):  
W. T. Pike

With the advent of crystal growth techniques which enable device structure control at the atomic level has arrived a need to determine the crystal structure at a commensurate scale. In particular, in epitaxial lattice mismatched multilayers, it is of prime importance to know the lattice parameter, and hence strain, in individual layers in order to explain the novel electronic behavior of such structures. In this work higher order Laue zone (holz) lines in the convergent beam microdiffraction patterns from a thermal emission transmission electron microscope (TEM) have been used to measure lattice parameters to an accuracy of a few parts in a thousand from nanometer areas of material.Although the use of CBM to measure strain using a dedicated field emission scanning transmission electron microscope has already been demonstrated, the recording of the diffraction pattern at the required resolution involves specialized instrumentation. In this work, a Topcon 002B TEM with a thermal emission source with condenser-objective (CO) electron optics is used.


Author(s):  
S.-S. Lee ◽  
J.-S. Seo ◽  
N.-S. Cho ◽  
S. Daniel

Abstract Both photo- and thermal emission analysis techniques are used from the backside of the die colocate defect sites. The technique is important in that process and package technologies have made front-side analysis difficult or impossible. Several test cases are documented. Intensity attenuation through the bulk of the silicon does not compromise the usefulness of the technique in most cases.


Sign in / Sign up

Export Citation Format

Share Document