State-generating matrix for differential Mueller matrices of depolarizing optical media

It is shown that a Mueller quaternion can be formulated as a quaternion with matrix coefficients, and this Mueller quaternion  transforms the Stokes quaternion for depolarizing  process as well as for nondepolarizing process. Mueller quaternion keeps track of the phase acquired by the Stokes quaternion and, in general,  quaternion states of optical media comprises all properties of Jones, Mueller-Jones and Mueller matrices.

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The Impact of Light Polarisation on Light Field of Scenes with Multiple Reflections

Light & Engineering ◽

10.33383/2019-023 ◽

2020 ◽

pp. 108-115 ◽

Cited By ~ 1

Author(s):

Vladimir P. Budak ◽

Anton V. Grimaylo

Keyword(s):

Mathematical Model ◽

Light Field ◽

Global Illumination ◽

Multiple Reflections ◽

Software Environment ◽

The Monte Carlo Method ◽

Mueller Matrices ◽

Volume Integration ◽

The Impact

The article describes the role of polarisation in calculation of multiple reflections. A mathematical model of multiple reflections based on the Stokes vector for beam description and Mueller matrices for description of surface properties is presented. On the basis of this model, the global illumination equation is generalised for the polarisation case and is resolved into volume integration. This allows us to obtain an expression for the Monte Carlo method local estimates and to use them for evaluation of light distribution in the scene with consideration of polarisation. The obtained mathematical model was implemented in the software environment using the example of a scene with its surfaces having both diffuse and regular components of reflection. The results presented in the article show that the calculation difference may reach 30 % when polarisation is taken into consideration as compared to standard modelling.

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Modelling Light Transmission in a Fiber-Optical Reflection System

Nonlinear Analysis Modelling and Control ◽

10.15388/na.2004.9.1.15170 ◽

2004 ◽

Vol 9 (1) ◽

pp. 55-63

Author(s):

V. Kleiza

Keyword(s):

Optical Sensors ◽

Light Transmission ◽

External Cavity ◽

Linear Displacement ◽

Fiber System ◽

Light Emitting ◽

Optical Media ◽

Reflected Light ◽

Fiber Optical ◽

Fiber Optical Sensors

Light transmission in the reflection fiber system, located in external optical media, has been investigated for application as sensors. The system was simulated by different models, including external cavity parameters such as the distance between light emitting and receiving fibers and mirror positioning distance. The sensitivity to a linear displacement of the sensors was studied as a function of the distance between the tips of the light emitting fiber and the center of the pair reflected light collecting fibers, by positioning a mirror. Physical fundamentals and operating principles of the advanced fiber optical sensors were revealed.

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Cataract. Diagnostic errors at referring patients to surgery

10.25276/978-5-94289-028-5 ◽

2020 ◽

Author(s):

V.V. Egorov ◽

◽

E.L. Sorokin ◽

G.P. Smoliakova ◽

O. V. Kolenko ◽

...

Keyword(s):

Clinical Diagnosis ◽

Diagnostic Errors ◽

Ophthalmological Examination ◽

Slit Lamp ◽

Critical View ◽

Optical Media

The textbook examines the most common diagnostic errors of ophthalmologists when making a clinical diagnosis of "cataract". Clinical examples point to a more critical view of the cataract diagnosis. Due to the fact that most of the errors are based on a superficial examination of the eye, clear recommendations are given for conducting a clinical ophthalmological examination of cataracts. At the same time, special attention is paid to the types of examination of the lens with the help of a slit lamp, to the peculiarities of performing various types of ophthalmoscopy with moderate opacity of optical media.

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Anisotropic dielectric susceptibility matrix of anisotropic medium

Scientific Reports ◽

10.1038/s41598-021-91435-5 ◽

2021 ◽

Vol 11 (1) ◽

Author(s):

Wanrong Gao

Keyword(s):

Light Scattering ◽

Anisotropic Medium ◽

Polarized Light ◽

Scattering Matrix ◽

Dielectric Susceptibility ◽

Anisotropic Dielectric ◽

New Methods ◽

Mueller Matrices ◽

Anisotropic Structures ◽

The Fourier Transform

AbstractIn this work, we introduce the concept of anisotropic dielectric susceptibility matrix of anisotropic medium for both nondepolarizing and depolarizing medium. The concept provides a new way of analyzing light scattering properties of anisotropic media illuminated by polarized light. The explicit expressions for the elements of the scattering matrix are given in terms of the elements of the Fourier transform of the anisotropic dielectric susceptibility matrix of the medium. Finally, expressions for the elements of the Jones matrix of a thin layer of a deterministic anisotropic medium and the elements of the Mueller matrix of a depolarizing medium are given. The results obtained in this work is helpful for deriving information about the correlated anisotropic structures in depolarizing media from measured Mueller matrices. The findings in this work may also well prove stimulating to researchers working on new methods for analyzing light scattering properties.

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Nonlinear optical media in photonic crystal waveguides: Intrinsic localized modes and device applications

Complexity ◽

10.1002/cplx.20184 ◽

2007 ◽

Vol 12 (5) ◽

pp. 18-32 ◽

Cited By ~ 5

Author(s):

A. R. McGurn

Keyword(s):

Photonic Crystal ◽

Nonlinear Optical ◽

Photonic Crystal Waveguides ◽

Localized Modes ◽

Intrinsic Localized Modes ◽

Optical Media ◽

Device Applications ◽

Nonlinear Optical Media

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Universal Synthesizer of Mueller Matrices Based on the Symmetry Properties of the Enpolarizing Ellipsoid

Symmetry ◽

10.3390/sym13060983 ◽

2021 ◽

Vol 13 (6) ◽

pp. 983

Author(s):

José J. Gil ◽

Ignacio San José

Keyword(s):

Mathematical Structure ◽

Mueller Matrix ◽

Morphological Properties ◽

Nondestructive Analysis ◽

Structural Decomposition ◽

Symmetry Properties ◽

Mueller Matrices ◽

Scattering Measurement ◽

The Way

Polarimetry is today a widely used and powerful tool for nondestructive analysis of the structural and morphological properties of a great variety of material samples, including aerosols and hydrosols, among many others. For each given scattering measurement configuration, absolute Mueller polarimeters provide the most complete polarimetric information, intricately encoded in the 16 parameters of the corresponding Mueller matrix. Thus, the determination of the mathematical structure of the polarimetric information contained in a Mueller matrix constitutes a topic of great interest. In this work, besides a structural decomposition that makes explicit the role played by the diattenuation-polarizance of a general depolarizing medium, a universal synthesizer of Muller matrices is developed. This is based on the concept of an enpolarizing ellipsoid, whose symmetry features are directly linked to the way in which the polarimetric information is organized.

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