Characterization of Integrated Polarization-Diversity DPSK Demodulator with Two-Dimensional Chirped Grating Couplers and Ring Resonators

Author(s):  
Xia Chen ◽  
Chao Li ◽  
Ying Gao ◽  
Lin Xu ◽  
Hon Ki Tsang ◽  
...  
2011 ◽  
Vol 284 (8) ◽  
pp. 2242-2244 ◽  
Author(s):  
Lin Xu ◽  
Xia Chen ◽  
Chao Li ◽  
Hon Ki Tsang

2014 ◽  
Vol 32 (10) ◽  
pp. 1144
Author(s):  
Ting TONG ◽  
Wanfeng ZHANG ◽  
Donghao LI ◽  
Jinhua ZHAO ◽  
Zhenyang CHANG ◽  
...  

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Prashanth Gopalan ◽  
Yunshan Wang ◽  
Berardi Sensale-Rodriguez

AbstractWhile terahertz spectroscopy can provide valuable information regarding the charge transport properties in semiconductors, its application for the characterization of low-conductive two-dimensional layers, i.e., σs <  < 1 mS, remains elusive. This is primarily due to the low sensitivity of direct transmission measurements to such small sheet conductivity levels. In this work, we discuss harnessing the extraordinary optical transmission through gratings consisting of metallic stripes to characterize such low-conductive two-dimensional layers. We analyze the geometric tradeoffs in these structures and provide physical insights, ultimately leading to general design guidelines for experiments enabling non-contact, non-destructive, highly sensitive characterization of such layers.


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