scholarly journals Vector analyses of linearly and circularly polarized Bessel beams using Hertz vector potentials

2014 ◽  
Vol 22 (7) ◽  
pp. 7821 ◽  
Author(s):  
Yanxun Wang ◽  
Wenbin Dou ◽  
Hongfu Meng
2021 ◽  
Vol 2015 (1) ◽  
pp. 012046
Author(s):  
S A Glukhova ◽  
M A Yurkin

Abstract We consider the simulation of scattering of the high-order vector Bessel beams in the discrete dipole approximation framework (DDA). For this purpose, a new general classification of all existing Bessel beam types was developed based on the superposition of transverse Hertz vector potentials. Next, we implemented these beams in ADDA code – an open-source parallel implementation of the DDA. The code enables easy and efficient simulation of Bessel beams scattering by arbitrary-shaped particles. Moreover, these results pave the way for the following research related to the Bessel beam scattering near a substrate and optical forces.


Author(s):  
Marcos F. Maestre

Recently we have developed a form of polarization microscopy that forms images using optical properties that have previously been limited to macroscopic samples. This has given us a new window into the distribution of structure on a microscopic scale. We have coined the name differential polarization microscopy to identify the images obtained that are due to certain polarization dependent effects. Differential polarization microscopy has its origins in various spectroscopic techniques that have been used to study longer range structures in solution as well as solids. The differential scattering of circularly polarized light has been shown to be dependent on the long range chiral order, both theoretically and experimentally. The same theoretical approach was used to show that images due to differential scattering of circularly polarized light will give images dependent on chiral structures. With large helices (greater than the wavelength of light) the pitch and radius of the helix could be measured directly from these images.


Author(s):  
S. Hasegawa ◽  
T. Kawasaki ◽  
J. Endo ◽  
M. Futamoto ◽  
A. Tonomura

Interference electron microscopy enables us to record the phase distribution of an electron wave on a hologram. The distribution is visualized as a fringe pattern in a micrograph by optical reconstruction. The phase is affected by electromagnetic potentials; scalar and vector potentials. Therefore, the electric and magnetic field can be reduced from the recorded phase. This study analyzes a leakage magnetic field from CoCr perpendicular magnetic recording media. Since one contour fringe interval corresponds to a magnetic flux of Φo(=h/e=4x10-15Wb), we can quantitatively measure the field by counting the number of finges. Moreover, by using phase-difference amplification techniques, the sensitivity for magnetic field detection can be improved by a factor of 30, which allows the drawing of a Φo/30 fringe. This sensitivity, however, is insufficient for quantitative analysis of very weak magnetic fields such as high-density magnetic recordings. For this reason we have adopted “fringe scanning interferometry” using digital image processing techniques at the optical reconstruction stage. This method enables us to obtain subfringe information recorded in the interference pattern.


2020 ◽  
Vol 13 (0) ◽  
pp. 1-11
Author(s):  
WANG Meng-Zhu ◽  
◽  
DENG Yong-Jing ◽  
LIU Shu-Juan ◽  
ZHAO Qiang

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