A Background Emission Correction System for Atomic Absorption Spectrometry

1981 ◽  
Vol 35 (2) ◽  
pp. 176-181 ◽  
Author(s):  
Frederic G. Dewalt ◽  
John R. Amend ◽  
Ray Woodriff

A simple system which corrects for both broad band absorption and broad band emission in thermally atomized atomic absorption spectroscopy is presented in this article.

1975 ◽  
Vol 29 (2) ◽  
pp. 154-158 ◽  
Author(s):  
T. H. Donnelly ◽  
A. J. Eccleston

The need for background correction in atomic absorption spectrometry (AAS), particularly when graphite furnaces are used to generate the atomic vapor, is discussed. It is shown that a Beckman hydrogen arc lamp is suitable as a continuum source from the point of view of noise, extent of its useful broad band absorption, and light intensity for background-corrected absorption (BCA) measurements over the wavelength range examined (200 to 460 nm). The standard method of determining tin present in rock samples as cassiterite, by extraction as the volatile tin iodide, was examined by flameless AAS with BCA. The method corrects for the large nonatomic absorption present, it is rapid, and it enables easier examination of solutions containing low concentrations of tin (detection limit for a 1 g starting sample is ∼1 jug tin).


2015 ◽  
Vol 7 (18) ◽  
pp. 7653-7658 ◽  
Author(s):  
Samira Vakilzadeh ◽  
Mohammad Eftekhari ◽  
Mahmoud Chamsaz ◽  
Farzaneh Javedani-Asleh

An efficient ion pair based dispersive liquid–liquid microextraction method was used for the preconcentration of ultra-trace levels of Bi(iii) prior to its determination by electrothermal atomic absorption spectrometry.


1983 ◽  
Vol 37 (5) ◽  
pp. 419-424 ◽  
Author(s):  
S. B. Smith ◽  
G. M. Hieftje

A new method is described and tested for background correction in atomic absorption spectrometry. Applicable to flame or furnace atomizers, the method is capable of correcting backgrounds caused by molecular absorption, particulate scattering, and atomic-line overlap, even up to an absorbance value of 3. Like the Zeeman approach, the new method applies its correction very near the atomic line of interest, can employ single-beam optics, and requires no auxiliary source. However, no ancillary magnet or other costly peripherals are required and working curves are single-valued. The new technique is based on the broadening which occurs in a hollow-cathode spectral line when the lamp is operated at high currents. Under such conditions, the absorbance measured for a narrow (atomic) line is low, whereas the apparent absorbance caused by a broad-band background contributor remains as high as when the lamp is operated at conventional current levels. Background correction can therefore be effected by taking the difference in absorbances measured with the lamp operated at high and low currents. The new technique is evaluated in its ability to correct several different kinds of background interference and is critically compared with competitive methods.


1994 ◽  
Vol 40 (3) ◽  
pp. 431-434 ◽  
Author(s):  
C Bradley ◽  
F Y Leung

Abstract We compared a stabilized-temperature L'vov platform furnace containing an end-heated graphite atomizer (HGA) and transverse Zeeman background-correction system with a side-heated furnace system (transversely heated graphite atomizer; THGA) containing a longitudinal Zeeman background-correction system for the determination of aluminum in plasma and urine. The regression statistics for the correlation analysis of the two systems (slope coefficient = 0.995, intercept = -1.710, Sy/x = 0.021 micrograms/L) indicate that the systems generate comparable results. The newer technology of the THGA furnace with its more uniform and faster heating cycle allows a lower atomization temperature for aluminum, 2200 degrees C. Analyte carryover was significantly reduced in the THGA furnace system. The THGA system generates results equivalent to HGA in about one-third less time, thus making possible a greater throughput of samples in a busy laboratory.


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