Application and Progress in the Scanning Probe Microscopy. Development of Single Electron Devices Fabricated by Scanning Tunneling Microscope(STM)/Atomic Force Microscope(AFM).
1997 ◽
Vol 15
(4)
◽
pp. 1531
1993 ◽
Vol 51
◽
pp. 704-705
1991 ◽
Vol 9
(2)
◽
pp. 1129
◽
1993 ◽
Vol 32
(Part 1, No. 6B)
◽
pp. 2983-2988
◽
1996 ◽
Vol 35
(Part 1, No. 6B)
◽
pp. 3767-3771
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2003 ◽
Vol 74
(8)
◽
pp. 3656-3663
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