A Theoretical Analysis of the Weak-beam Method of Electron Microscopy
1972 ◽
Vol 27
(3)
◽
pp. 452-460
◽
Keyword(s):
AbstractThe geometry of lattice defects can be studied in detail using the weak-beam method 1 of high resolution electron microscopy. In this paper the theoretical basis of the method is discussed, and the experimental conditions which are necessary if particular methods of image interpretation are to be used are considered.
1978 ◽
Vol 36
(1)
◽
pp. 182-183
1991 ◽
Vol 6
(1)
◽
pp. 138-145
◽
1986 ◽
Vol 44
◽
pp. 384-387
1983 ◽
Vol 41
◽
pp. 738-739
1983 ◽
Vol 41
◽
pp. 730-731
1978 ◽
Vol 36
(1)
◽
pp. 274-275
1978 ◽
Vol 36
(1)
◽
pp. 222-223
◽
1988 ◽
Vol 46
◽
pp. 540-541
1986 ◽
Vol 44
◽
pp. 390-391
1995 ◽
Vol 53
◽
pp. 172-173