Simple Semiempirical Method of Calculating van der Waals Interactions in Thin Films from Lifshitz Theory
1976 ◽
Vol 31
(12)
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pp. 1584-1588
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Keyword(s):
AbstractThe influence of different representations of the dispersion dependence ε (i ξ) on calculating van der Waals interactions from Lifshitz theory is studied. It is shown that with satisfactory accuracy ε (i ξ) can be described by means of Krupp's empirical formula [ε (i ξ) -1]/[ε (i ξ) +1] = a · exp(-b ξ). Making use of that formula a simple expression for the Hamaker function A (h, T) is obtained. Numerical calculations are carried out, the results being compared with those of other authors and with experimental data.
2019 ◽
Vol 3
(7)
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pp. 1462-1470
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2012 ◽
Vol 411
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pp. 87-93
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Keyword(s):
1973 ◽
Vol 44
(3)
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pp. 456-463
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2019 ◽
2000 ◽
Vol 65
(12)
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pp. 1950-1958
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Keyword(s):