On the S-phase precipitates in 2024 aluminum alloy: An atomic-scale investigation using high-angle annular dark-field scanning transmission electron microscopy

Journal of Materials Research ◽

10.1557/jmr.2020.74 ◽

2020 ◽

Vol 35 (12) ◽

pp. 1582-1589

Author(s):

Chenyang Zhu ◽

Kexin Lv ◽

Bin Chen

Keyword(s):

Scanning Transmission Electron Microscopy ◽

S Phase ◽

Atomic Scale ◽

2024 Aluminum Alloy ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Abstract

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Simulation of atomic-scale high-angle annular dark field scanning transmission electron microscopy images

Journal of Electron Microscopy ◽

10.1093/oxfordjournals.jmicro.a023868 ◽

2000 ◽

Vol 49 (6) ◽

pp. 753-759 ◽

Author(s):

T. Yamazaki ◽

K. Watanabe ◽

A. Recnik ◽

M. Ceh ◽

M. Kawasaki ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Atomic Scale ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Microscopy Images

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The effect of cation ordering and domain boundaries on low loss Ba(BI1/3BII2/3)O3 perovskite dielectrics revealed by high-angle annular dark-field scanning transmission electron microscopy (HAADF STEM)

Journal of the European Ceramic Society ◽

10.1016/j.jeurceramsoc.2014.03.007 ◽

2014 ◽

Vol 34 (10) ◽

pp. 2285-2297 ◽

Author(s):

Feridoon Azough ◽

Robert Freer ◽

David Iddles ◽

Takeshi Shimada ◽

Bernhard Schaffer

Keyword(s):

Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Cation Ordering ◽

Low Loss ◽

Transmission Electron ◽

Domain Boundaries ◽

Scanning Transmission ◽

Annular Dark Field

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Structural study of an Al73Ni22Fe5 decagonal quasicrystal by high-angle annular dark-field scanning transmission electron microscopy

10.1093/jmicro/50.3.197 ◽

2001 ◽

Vol 50 (3) ◽

pp. 197-203 ◽

Author(s):

K. Saitoh ◽

M. Tanaka ◽

P. Tsai

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Structural Study ◽

Scanning Transmission Electron Microscopy ◽

Decagonal Quasicrystal ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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Bayesian tomographic reconstruction for high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM)

2012 IEEE Statistical Signal Processing Workshop (SSP) ◽

10.1109/ssp.2012.6319793 ◽

2012 ◽

Author(s):

Singanallur Venkatakrishnan ◽

Lawrence Drummy ◽

Michael Jackson ◽

Marc De Graef ◽

Jeff Simmons ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Tomographic Reconstruction ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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Quantitative Two-Dimensional (2D) Morphology–Selectivity Relationship of CoMoS Nanolayers: A Combined High-Resolution High-Angle Annular Dark Field Scanning Transmission Electron Microscopy (HR HAADF-STEM) and Density Functional Theory (DFT) Study

ACS Catalysis ◽

10.1021/acscatal.5b02628 ◽

2016 ◽

Vol 6 (2) ◽

pp. 1081-1092 ◽

Author(s):

Bertrand Baubet ◽

Maria Girleanu ◽

Anne-Sophie Gay ◽

Anne-Lise Taleb ◽

Maxime Moreaud ◽

...

Keyword(s):

Scanning Transmission Electron Microscopy ◽

Density Functional ◽

Two Dimensional ◽

Functional Theory ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Relationship Of

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Direct Observation of Atomic Ordering and Interface Structure in Co2MnSi/MgO/Co2MnSi Magnetic Tunnel Junctions by High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy

Applied Physics Express ◽

10.1143/apex.2.093001 ◽

2009 ◽

Vol 2 (9) ◽

pp. 093001 ◽

Author(s):

Toyoo Miyajima ◽

Mikihiko Oogane ◽

Yasutoshi Kotaka ◽

Takashi Yamazaki ◽

Mineharu Tsukada ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Tunnel Junctions ◽

Interface Structure ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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Imaging of high-angle annular dark-field scanning transmission electron microscopy and observations of GaN-based violet laser diodes

Journal of Microscopy ◽

10.1111/j.1365-2818.2006.01613.x ◽

2006 ◽

Vol 223 (3) ◽

pp. 172-178 ◽

Author(s):

M. SHIOJIRI ◽

H. SAIJO

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Laser Diodes ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy: A comparison study in terms of integrated intensity and atomic column position measurement

Ultramicroscopy ◽

10.1016/j.ultramic.2017.08.021 ◽

2018 ◽

Vol 184 ◽

pp. 188-198

Author(s):

M. Alania ◽

I. Lobato ◽

S. Van Aert

Keyword(s):

Scanning Transmission Electron Microscopy ◽

Comparison Study ◽

Position Measurement ◽

Atomic Column ◽

Transmission Electron ◽

Scanning Transmission ◽

Integrated Intensity ◽

Annular Dark Field

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Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images

Ultramicroscopy ◽

10.1016/j.ultramic.2013.03.018 ◽

2013 ◽

Vol 131 ◽

pp. 1-9 ◽

Author(s):

Thorsten Mehrtens ◽

Knut Müller ◽

Marco Schowalter ◽

Dongzhi Hu ◽

Daniel M. Schaadt ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Concentration Profiles ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Microscopy Images

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Comparison of Interface Characterization between Ag(In,Ga)Se$_{2}$ and Cu(In,Ga)Se$_{2}$ Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.126603 ◽

2011 ◽

Vol 50 ◽

pp. 126603 ◽

Author(s):

Zhang Xianfeng ◽

Tsuyoshi Kobayashi ◽

Yasuyoshi Kurokawa ◽

Yoshiyuki Tashiro ◽

Masahiro Ohtsuka ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Solar Cells ◽

Scanning Transmission Electron Microscopy ◽

Interface Characterization ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field

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