Frozen lattice and absorptive model for high angle annular dark field scanning transmission electron microscopy: A comparison study in terms of integrated intensity and atomic column position measurement

Dark Field ◽

Comparison Study ◽

High Angle ◽

Position Measurement ◽

Atomic Column ◽

Transmission Electron ◽

Scanning Transmission ◽

Integrated Intensity ◽

The effect of cation ordering and domain boundaries on low loss Ba(BI1/3BII2/3)O3 perovskite dielectrics revealed by high-angle annular dark-field scanning transmission electron microscopy (HAADF STEM)

Journal of the European Ceramic Society ◽

10.1016/j.jeurceramsoc.2014.03.007 ◽

2014 ◽

Vol 34 (10) ◽

pp. 2285-2297 ◽

Cited By ~ 5

Author(s):

Feridoon Azough ◽

Robert Freer ◽

David Iddles ◽

Takeshi Shimada ◽

Bernhard Schaffer

Keyword(s):

Electron Microscopy ◽

Dark Field ◽

Cation Ordering ◽

High Angle ◽

Low Loss ◽

Transmission Electron ◽

Domain Boundaries ◽

Scanning Transmission ◽

On the S-phase precipitates in 2024 aluminum alloy: An atomic-scale investigation using high-angle annular dark-field scanning transmission electron microscopy

Journal of Materials Research ◽

10.1557/jmr.2020.74 ◽

2020 ◽

Vol 35 (12) ◽

pp. 1582-1589

Author(s):

Chenyang Zhu ◽

Kexin Lv ◽

Bin Chen

Keyword(s):

Dark Field ◽

S Phase ◽

Atomic Scale ◽

High Angle ◽

2024 Aluminum Alloy ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Image Position

Abstract

Structural study of an Al73Ni22Fe5 decagonal quasicrystal by high-angle annular dark-field scanning transmission electron microscopy

Microscopy ◽

10.1093/jmicro/50.3.197 ◽

2001 ◽

Vol 50 (3) ◽

pp. 197-203 ◽

Cited By ~ 5

Author(s):

K. Saitoh ◽

M. Tanaka ◽

P. Tsai

Keyword(s):

Electron Microscopy ◽

Structural Study ◽

Dark Field ◽

High Angle ◽

Decagonal Quasicrystal ◽

Transmission Electron ◽

Scanning Transmission ◽

Bayesian tomographic reconstruction for high angle annular dark field (HAADF) scanning transmission electron microscopy (STEM)

2012 IEEE Statistical Signal Processing Workshop (SSP) ◽

10.1109/ssp.2012.6319793 ◽

2012 ◽

Cited By ~ 4

Author(s):

Singanallur Venkatakrishnan ◽

Lawrence Drummy ◽

Michael Jackson ◽

Marc De Graef ◽

Jeff Simmons ◽

...

Keyword(s):

Electron Microscopy ◽

Tomographic Reconstruction ◽

Dark Field ◽

High Angle ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Quantitative Two-Dimensional (2D) Morphology–Selectivity Relationship of CoMoS Nanolayers: A Combined High-Resolution High-Angle Annular Dark Field Scanning Transmission Electron Microscopy (HR HAADF-STEM) and Density Functional Theory (DFT) Study

ACS Catalysis ◽

10.1021/acscatal.5b02628 ◽

2016 ◽

Vol 6 (2) ◽

pp. 1081-1092 ◽

Cited By ~ 38

Author(s):

Bertrand Baubet ◽

Maria Girleanu ◽

Anne-Sophie Gay ◽

Anne-Lise Taleb ◽

Maxime Moreaud ◽

...

Keyword(s):

Density Functional ◽

Dark Field ◽

Two Dimensional ◽

High Angle ◽

Functional Theory ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Relationship Of

Direct Observation of Atomic Ordering and Interface Structure in Co2MnSi/MgO/Co2MnSi Magnetic Tunnel Junctions by High-Angle Annular Dark-Field Scanning Transmission Electron Microscopy

Applied Physics Express ◽

10.1143/apex.2.093001 ◽

2009 ◽

Vol 2 (9) ◽

pp. 093001 ◽

Cited By ~ 16

Author(s):

Toyoo Miyajima ◽

Mikihiko Oogane ◽

Yasutoshi Kotaka ◽

Takashi Yamazaki ◽

Mineharu Tsukada ◽

...

Keyword(s):

Electron Microscopy ◽

Tunnel Junctions ◽

Interface Structure ◽

Dark Field ◽

High Angle ◽

Transmission Electron ◽

Scanning Transmission ◽

Imaging of high-angle annular dark-field scanning transmission electron microscopy and observations of GaN-based violet laser diodes

Journal of Microscopy ◽

10.1111/j.1365-2818.2006.01613.x ◽

2006 ◽

Vol 223 (3) ◽

pp. 172-178 ◽

Cited By ~ 19

Author(s):

M. SHIOJIRI ◽

H. SAIJO

Keyword(s):

Electron Microscopy ◽

Laser Diodes ◽

Dark Field ◽

High Angle ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Measurement of indium concentration profiles and segregation efficiencies from high-angle annular dark field-scanning transmission electron microscopy images

Ultramicroscopy ◽

10.1016/j.ultramic.2013.03.018 ◽

2013 ◽

Vol 131 ◽

pp. 1-9 ◽

Cited By ~ 14

Author(s):

Thorsten Mehrtens ◽

Knut Müller ◽

Marco Schowalter ◽

Dongzhi Hu ◽

Daniel M. Schaadt ◽

...

Keyword(s):

Electron Microscopy ◽

Dark Field ◽

Concentration Profiles ◽

High Angle ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Microscopy Images

Comparison of Interface Characterization between Ag(In,Ga)Se$_{2}$ and Cu(In,Ga)Se$_{2}$ Solar Cells by High-Angle-Annular Dark-Field Scanning Transmission Electron Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.126603 ◽

2011 ◽

Vol 50 ◽

pp. 126603 ◽

Cited By ~ 1

Author(s):

Zhang Xianfeng ◽

Tsuyoshi Kobayashi ◽

Yasuyoshi Kurokawa ◽

Yoshiyuki Tashiro ◽

Masahiro Ohtsuka ◽

...

Keyword(s):

Electron Microscopy ◽

Solar Cells ◽

Dark Field ◽

High Angle ◽

Interface Characterization ◽

Transmission Electron ◽

Scanning Transmission ◽

Atomic resolution composition analysis by scanning transmission electron microscopy high-angle annular dark-field imaging

Applied Physics Letters ◽

10.1063/1.1592314 ◽

2003 ◽

Vol 83 (4) ◽

pp. 662-664 ◽

Cited By ~ 25

Author(s):

E. Carlino ◽

S. Modesti ◽

D. Furlanetto ◽

M. Piccin ◽

S. Rubini ◽

...

Keyword(s):

Dark Field ◽

Atomic Resolution ◽

Composition Analysis ◽

High Angle ◽

Dark Field Imaging ◽

Transmission Electron ◽

Scanning Transmission ◽

Annular Dark Field ◽

Field Imaging