GaAs Pixel Detectors

2013 ◽  
Vol 1576 ◽  
Author(s):  
A. Tyazhev ◽  
D. Budnitsky ◽  
D. Mokeev ◽  
V. Novikov ◽  
A. Zarubin ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Spatial Resolution ◽  
Carrier Lifetime ◽  
Nonequilibrium Charge Carrier ◽  
Physical Parameters ◽  
High Quality ◽  
X Ray ◽  
Pixel Detectors ◽  
Charge Carrier Lifetime ◽  
Pixel Pitch

ABSTRACTResults of investigation of X-ray sensors on the basis of GaAs compensated with chromium (HR GaAs) are presented in this work. HR GaAs material is shown to have the following physical parameters: the resistivity about 1GOhm*cm, the nonequilibrium charge carrier lifetime – hundreds of nanoseconds. Prototypes of microstrip and array HR GaAs sensors have been manufactured and tested. It is demonstrated that the sensors provide spatial resolution according to the pixel pitch and allow obtaining high quality X-ray images.

Nonequilibrium Charge Carrier Lifetime Testing Equipment for Semiconductor Materials by a Contactless Microwave Phase Method

2013 ◽  
Vol 655-657 ◽  
pp. 830-833
Author(s):  
Song Chen ◽  
Zu Rong Ni ◽  
Fen Xiao
Keyword(s):  
Charge Carrier ◽  
Carrier Lifetime ◽  
Crystalline Silicon ◽  
Nonequilibrium Charge Carrier ◽  
Testing Equipment ◽  
Phase Method ◽  
Automatic Data ◽  
Crystalline Silicon Solar Cells ◽  
Lock In ◽  
Charge Carrier Lifetime

The accurate measurement of nonequilibrium charge carrier lifetime is of vital significance in research and manufacture of crystalline silicon solar cells. A testing equipment based on a contactless microwave phase method was implemented by being embedded with GPIB, FPGA and a lock-in analyzer. A friendly operation interface was developed, based on the graphic programming language LabVIEW. The virtue of the equipment is achieved by automatic data acquisition and processing, which improves the automatization, efficiency and accuracy of the measurement.

scholarly journals Extraordinarily High Minority Charge Carrier Lifetime Observed in Crystalline Silicon

Solar RRL ◽  
2021 ◽  
Author(s):  
Bernd Steinhauser ◽  
Tim Niewelt ◽  
Armin Richter ◽  
Rebekka Eberle ◽  
Martin Schubert
Keyword(s):  
Charge Carrier ◽  
Carrier Lifetime ◽  
Crystalline Silicon ◽  
Minority Charge Carrier ◽  
Charge Carrier Lifetime

scholarly journals Enhancing Charge Carrier Lifetime in Metal Oxide Photoelectrodes through Mild Hydrogen Treatment

2017 ◽  
Vol 7 (22) ◽  
pp. 1701536 ◽  
Author(s):  
Ji-Wook Jang ◽  
Dennis Friedrich ◽  
Sönke Müller ◽  
Marlene Lamers ◽  
Hannes Hempel ◽  
...  
Keyword(s):  
Charge Carrier ◽  
Metal Oxide ◽  
Carrier Lifetime ◽  
Hydrogen Treatment ◽  
Charge Carrier Lifetime
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