Nanofabrication of High-resolution and Nanofocusing X-ray Optics Based on Silicon and Diamond: Obstacles and Progress

2008 ◽  
Vol 1145 ◽  
Author(s):  
Abdel F. Isakovic ◽  
K. Evans-Lutterodt ◽  
A. Stein ◽  
J. B. Warren ◽  
S. Narayanan ◽  
...  

AbstractNanofocusing, high-resolution X-ray optics demand good surface quality, the absence of tapered sidewalls, and a depth reaching into tens, sometimes hundreds of microns, all requirements that must be satisfied over large areas. In this report, we discuss our motivation for choosing group IV materials (predominantly Si, and C in its diamond form) for nanofocusing and high resolution in the hard X-ray portion of the spectrum. We elaborate on the design and nanofabrication procedures, and detail the etching parameters that offer a path for overcoming obstacles in making better optics. We briefly review tests for the assessing the quality of the optics.

e-Polymers ◽  
2020 ◽  
Vol 20 (1) ◽  
pp. 519-527
Author(s):  
Wei Gong ◽  
Xianglin Pei ◽  
Xiaogang Yin ◽  
Daming Ban ◽  
Hai Fu ◽  
...  

AbstractIn this paper, acrylonitrile and hydroxypropyl acrylate are used as the binary polymerization monomers, and isooctane is used as the foaming agent to prepare high-temperature thermally expandable microcapsules. Analysis of the effect of blowing agent and crosslinking agent on the expansion properties of high-temperature thermally expandable microcapsules, the effects of foaming agent azodicarbonamide (ADCA) and micro-expansion capsule on the surface quality and foaming quality of foamed acrylonitrile–butadiene–styrene (ABS) products were investigated. The foamed product prepared by the high-temperature microcapsule has a good surface quality, the gloss is 52.3, the cell is not easily deformed, and the volume fraction is 4%; the foamed ABS/ADCA material has poor cell uniformity, the cell is easily deformed, the volume fraction is 6.5%, the surface quality is poor, and the gloss is only 8.7.


2005 ◽  
Vol 61 (2) ◽  
pp. 129-132 ◽  
Author(s):  
E. N. Caspi ◽  
B. Pokroy ◽  
P. L. Lee ◽  
J. P. Quintana ◽  
E. Zolotoyabko

High-resolution synchrotron powder diffraction measurements were carried out at the 32-ID beamline of the Advanced Photon Source of Argonne National Laboratory in order to clarify the structure of geological aragonite, a widely abundant polymorph of CaCO3. The investigated crystals were practically free of impurity atoms, as measured by wavelength-dispersive X-ray spectroscopy in scanning electron microscopy. A superior quality of diffraction data was achieved by using the 11-channel 111 Si multi-analyzer of the diffracted beam. Applying the Rietveld refinement procedure to the high-resolution diffraction spectra, we were able to extract the aragonite lattice parameters with an accuracy of about 20 p.p.m. The data obtained unambiguously confirm that pure aragonite crystals have orthorhombic symmetry.


2010 ◽  
Author(s):  
Stanislav Stoupin ◽  
Frank Lenkszus ◽  
Robert Laird ◽  
Kurt Goetze ◽  
Kwang-Je Kim ◽  
...  
Keyword(s):  

2004 ◽  
Author(s):  
Marco Beijersbergen ◽  
Stefan Kraft ◽  
Ramses Gunther ◽  
Arjan L. Mieremet ◽  
Maximilien Collon ◽  
...  
Keyword(s):  

2012 ◽  
Vol 188 ◽  
pp. 411-416 ◽  
Author(s):  
Ikuyuki Mitsuishi ◽  
Yuichiro Ezoe ◽  
Kensuke Ishizu ◽  
Teppei Moriyama ◽  
Makoto Mita ◽  
...  

2014 ◽  
Vol 59 (3) ◽  
pp. 315-322 ◽  
Author(s):  
A. E. Blagov ◽  
A. L. Vasiliev ◽  
A. S. Golubeva ◽  
I. A. Ivanov ◽  
O. A. Kondratev ◽  
...  

2008 ◽  
Vol 1069 ◽  
Author(s):  
Hui Chen ◽  
Guan Wang ◽  
Michael Dudley ◽  
Zhou Xu ◽  
James. H. Edgar ◽  
...  

ABSTRACTA systematic study is presented of the heteroepitaxial growth of B12As2 on m-plane 15R-SiC. In contrast to previous studies of B12As2 on other substrates, including (100) Si, (110) Si, (111) Si and (0001) 6H-SiC, single crystalline and untwinned B12As2 was achieved on m-plane 15R-SiC. Observations of IBA on m-plane (1100)15R-SiC by synchrotron white beam x-ray topography (SWBXT) and high resolution transmission electron microscopy (HRTEM) confirm the good quality of the films on the 15R-SiC substrates. The growth mechanism of IBA on m-plane 15R-SiC is discussed. This work demonstrates that m-plane 15R-SiC is potentially a good substrate choice to grow high quality B12As2 epilayers.


Author(s):  
F J Ma ◽  
D M Guo ◽  
R K Kang ◽  
Y J Ren

It is usually hard to obtain a good surface quality of carbon/carbon (C/C) composite by turning due to its non-homogeneity and anisotropy. Contrasting experiments of ultrasonic assisted turning (UAT) and common turning (CT) of the C/C composite were carried out using a polycrystalline diamond tool. The cylindrical surface of the turning was classified into four typical types based on different fibre orientations. The influence of fibre distribution characteristics on surface roughness was analysed by measuring and comparing the roughness of these surfaces, and an evaluation method of surface quality for the C/C composite after turning was established. The results of UAT experiments on the C/C composite show that UAT could effectively reduce the machining defect. The roughness of typical surfaces 1 and 2 machined using UAT was about 20 per cent lower than that using CT.


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