Laser Induced Photochemical Vapor Deposition of Tungsten on Silicon
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193 Nm
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AbstractAn ArF excimer laser (193 nm) aligned parallel to the substrate has been used to initiate photo-activation of the W-CVD process. W was deposited on silicon and SIMOX at a 310 °C substrate temperature using WF6 as a W precursor, together with H2. The samples were analyzed after deposition with SEM and 2 MeV He+ RBS, to obtain information about the reaction between WF6 and Si in laser-induced CVD of W. The data indicate that the reaction between WF6 and Si is suppressed upon laser irradiation. The suppression increases with increasing laser-pulse frequency. An explanation for this phenomenon is given in terms of atomic Hformation after (partial) photodissociation of WF6.
1992 ◽
Vol 139
(8)
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pp. 2314-2318
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2009 ◽
Vol 48
(10)
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pp. 102301
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1995 ◽
Vol 34
(Part 2, No. 11A)
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pp. L1482-L1485
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